Morokuma; Hidetoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Morokuma; Hidetoshi.The latest application filed is for "mass spectrometer".

Company Profile

1.90.76

Morokuma; Hidetoshi - Hitachinaka N/A JP
Morokuma; Hidetoshi - Ibaraki JP
Morokuma; Hidetoshi - Tokyo JP
MOROKUMA; Hidetoshi - Hitachinaka-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Mass spectrometer and mass analyzing method for efficiently ionizing a sample with less carry-over Grant 9,543,135 - Kumano , et al. January 10, 2	2017-01-10
Mass spectrometer Grant 9,281,169 - Morokuma , et al. March 8, 2	2016-03-08
Sample preparation container Grant D748,813 - Ishiguro , et al. February 2, 2	2016-02-02
Component analyzer Grant D746,476 - Noda , et al. December 29, 2	2015-12-29
Mass spectrometer and mass analyzing method Grant 9,184,037 - Kumano , et al. November 10, 2	2015-11-10
Mass spectrometer Grant 9,171,704 - Morokuma , et al. October 27, 2	2015-10-27
Mass spectrometer and mass spectrometry Grant 9,105,453 - Shishika , et al. August 11, 2	2015-08-11
Mass Spectrometer App 20150187554 - MOROKUMA; Hidetoshi ; et al.	2015-07-02
Mass Spectrometer And Mass Spectrometry App 20150108341 - Shishika; Tsukasa ; et al.	2015-04-23
Mass spectrometer Grant 9,006,679 - Morokuma , et al. April 14, 2	2015-04-14
Mass Spectrometer App 20150041641 - MOROKUMA; Hidetoshi ; et al.	2015-02-12
Method and apparatus for monitoring cross-sectional shape of a pattern formed on a semiconductor device Grant 8,881,067 - Nagatomo , et al. November 4, 2	2014-11-04
Method and apparatus for creating imaging recipe Grant RE45,224 - Miyamoto , et al. October 28, 2	2014-10-28
Mass spectrometer Grant 8,866,070 - Morokuma , et al. October 21, 2	2014-10-21
Method and apparatus for creating imaging recipe Grant RE45,204 - Miyamoto , et al. October 21, 2	2014-10-21
Scanning electron microscope and a method for imaging a specimen using the same Grant 8,853,630 - Miyamoto , et al. October 7, 2	2014-10-07
Sample holder for a component analyzer Grant D711,011 - Noda , et al. August 12, 2	2014-08-12
Mass spectrometer and mass spectrometry Grant 8,803,084 - Nishimura , et al. August 12, 2	2014-08-12
Component analyzer Grant D708,530 - Noda , et al. July 8, 2	2014-07-08
Scanning Electron Microscope And A Method For Imaging A Specimen Using The Same App 20140145078 - Miyamoto; Atsushi ; et al.	2014-05-29
Mass spectrometry method Grant 8,710,430 - Sugiyama , et al. April 29, 2	2014-04-29
Mass spectrometer Grant 8,680,464 - Hashimoto , et al. March 25, 2	2014-03-25
Mass spectrometer Grant 8,669,518 - Ishiguro , et al. March 11, 2	2014-03-11
Mass spectrometer Grant 8,664,588 - Noda , et al. March 4, 2	2014-03-04
Scanning electron microscope Grant 8,666,165 - Yamaguchi , et al. March 4, 2	2014-03-04
Scanning electron microscope and a method for imaging a specimen using the same Grant 8,642,957 - Miyamoto , et al. February 4, 2	2014-02-04
Mass Spectrometer App 20130320207 - MOROKUMA; Hidetoshi ; et al.	2013-12-05
Pattern measuring method and pattern measuring device Grant 8,507,856 - Sutani , et al. August 13, 2	2013-08-13
Method And Apparatus For Monitoring Cross-sectional Shape Of A Pattern Formed On A Semiconductor Device App 20130195346 - Nagatomo; Wataru ; et al.	2013-08-01
Mass Spectrometer And Mass Spectrometry App 20130161507 - NISHIMURA; Kazushige ; et al.	2013-06-27
Pattern measurement apparatus Grant 8,445,871 - Matsuoka , et al. May 21, 2	2013-05-21
Mass Spectrometer App 20130056633 - HASHIMOTO; Yuichiro ; et al.	2013-03-07
Mass Spectrometer And Mass Analyzing Method App 20130048851 - KUMANO; Shun ; et al.	2013-02-28
Mass Spectrometer App 20130032711 - ISHIGURO; Koji ; et al.	2013-02-07
Analyzer, ionization apparatus and analyzing method Grant 8,368,013 - Ishimaru , et al. February 5, 2	2013-02-05
Method and apparatus for monitoring cross-sectional shape of a pattern formed on a semiconductor device Grant 8,356,260 - Nagatomo , et al. January 15, 2	2013-01-15
Mass Spectrometry Method App 20120326027 - SUGIYAMA; Masuyuki ; et al.	2012-12-27
Mass Spectrometer And Mass Analyzing Method App 20120326022 - KUMANO; Shun ; et al.	2012-12-27
Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus Grant 8,338,804 - Morokuma , et al. December 25, 2	2012-12-25
Drug detection equipment Grant 8,319,194 - Hashimoto , et al. November 27, 2	2012-11-27
Mass Spectrometer App 20120248305 - NODA; Hiroyuki ; et al.	2012-10-04
Pattern Measuring Method And Pattern Measuring Device App 20120211653 - SUTANI; Takumichi ; et al.	2012-08-23
Pattern matching method and computer program for executing pattern matching Grant 8,244,042 - Sugiyama , et al. August 14, 2	2012-08-14
Scanning Electron Microscope and a Method for Imaging a Specimen Using the Same App 20120181426 - Miyamoto; Atsushi ; et al.	2012-07-19
Image forming method and charged particle beam apparatus Grant 8,203,504 - Kobaru , et al. June 19, 2	2012-06-19
Mass Spectrometer App 20120112061 - MOROKUMA; Hidetoshi ; et al.	2012-05-10
Pattern displacement measuring method and pattern measuring device Grant 8,173,962 - Sutani , et al. May 8, 2	2012-05-08
Scanning electron microscope and a method for imaging a specimen using the same Grant 8,158,938 - Miyamoto , et al. April 17, 2	2012-04-17
Drug Detection Equipment App 20120049055 - Hashimoto; Makoto ; et al.	2012-03-01
Method and system of displaying an exposure condition Grant 8,095,896 - Koike , et al. January 10, 2	2012-01-10
Mass Spectrometer App 20110315869 - ISHIGURO; KOUJI ; et al.	2011-12-29
SEM system and a method for producing a recipe Grant 8,073,242 - Miyamoto , et al. December 6, 2	2011-12-06
Analyzer, Ionization Apparatus And Analyzing Method App 20110253889 - ISHIMARU; Masako ; et al.	2011-10-20
Mass Spectrometer App 20110253891 - HASHIMOTO; Yuichiro ; et al.	2011-10-20
Method, device and computer program of length measurement Grant 8,019,161 - Morokuma , et al. September 13, 2	2011-09-13
Sample Dimension Inspecting/measuring Method And Sample Dimension Inspecting/measuring Apparatus App 20110158543 - Morokuma; Hidetoshi ; et al.	2011-06-30
Pattern Matching Method And Computer Program For Executing Pattern Matching App 20110150345 - SUGIYAMA; Akiyuki ; et al.	2011-06-23
Method and apparatus for observing a specimen Grant 7,935,927 - Miyamoto , et al. May 3, 2	2011-05-03
Pattern matching method and computer program for executing pattern matching Grant 7,925,095 - Sugiyama , et al. April 12, 2	2011-04-12
Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus Grant 7,923,703 - Morokuma , et al. April 12, 2	2011-04-12
Pattern matching method and pattern matching program Grant 7,889,909 - Shindo , et al. February 15, 2	2011-02-15
Method and apparatus for measuring shape of a specimen Grant 7,889,908 - Miyamoto , et al. February 15, 2	2011-02-15
Image Forming Method And Charged Particle Beam Apparatus App 20110032176 - KOBARU; Atsushi ; et al.	2011-02-10
Method and apparatus for semiconductor device production process monitoring and method and apparatus for estimating cross sectional shape of a pattern Grant 7,816,062 - Nagatomo , et al. October 19, 2	2010-10-19
Image forming method and charged particle beam apparatus Grant 7,817,105 - Kobaru , et al. October 19, 2	2010-10-19
Pattern Measurement Apparatus App 20100202654 - MATSUOKA; Ryoichi ; et al.	2010-08-12
Charged particle system Grant 7,772,554 - Sugiyama , et al. August 10, 2	2010-08-10
Charged Particle Beam Adjusting Method And Charged Particle Beam Apparatus App 20100181478 - Morokuma; Hidetoshi ; et al.	2010-07-22
Pattern Displacement Measuring Method And Pattern Measuring Device App 20100140472 - SUTANI; Takumichi ; et al.	2010-06-10
Pattern measurement apparatus Grant 7,732,792 - Matsuoka , et al. June 8, 2	2010-06-08
System and Method for Detecting a Defect App 20100138801 - MATSUOKA; Ryoichi ; et al.	2010-06-03
Charged particle beam adjusting method and charged particle beam apparatus Grant 7,705,300 - Morokuma , et al. April 27, 2	2010-04-27
Method and apparatus for monitoring exposure process Grant 7,685,560 - Nagatomo , et al. March 23, 2	2010-03-23
Pattern displacement measuring method and pattern measuring device Grant 7,679,055 - Sutani , et al. March 16, 2	2010-03-16
System and method for detecting defects in a semiconductor during manufacturing thereof Grant 7,681,159 - Matsuoka , et al. March 16, 2	2010-03-16
Sample Dimension Inspecting/measuring Method And Sample Dimension Inspecting/measuring Apparatus App 20090218491 - Morokuma; Hidetoshi ; et al.	2009-09-03
Pattern Measuring Method And Pattern Measuring Device App 20090200465 - SUTANI; Takumichi ; et al.	2009-08-13
Method and apparatus for creating imaging recipe Grant 7,559,047 - Miyamoto , et al. July 7, 2	2009-07-07
Scanning electron microscope Grant 7,521,695 - Nakada , et al. April 21, 2	2009-04-21
Pattern measuring method and pattern measuring device Grant 7,518,110 - Sutani , et al. April 14, 2	2009-04-14
Pattern Measurement Apparatus App 20090039263 - MATSUOKA; Ryoichi ; et al.	2009-02-12
Scanning Electron Microscope App 20090041333 - YAMAGUCHI; Satoru ; et al.	2009-02-12
Method and apparatus of measuring pattern dimension and controlling semiconductor device process having an error revising unit Grant 7,459,712 - Tanaka , et al. December 2, 2	2008-12-02
Scanning electron microscope Grant 7,439,505 - Yamaguchi , et al. October 21, 2	2008-10-21
Charged Particle System App 20080245965 - Sugiyama; Akiyuki ; et al.	2008-10-09
Method And Apparatus For Observing A Specimen App 20080237456 - MIYAMOTO; Atsushi ; et al.	2008-10-02
Pattern displacement measuring method and pattern measuring device App 20080224035 - Sutani; Takumichi ; et al.	2008-09-18
Method and System of Displaying an Exposure Condition App 20080204405 - Koike; Hirohito ; et al.	2008-08-28
Sem System And A Method For Producing A Recipe For Imaging Or Measuring A Specimen By Using The Sem System App 20080159609 - Miyamoto; Atsushi ; et al.	2008-07-03
Charged particle beam adjustment method and apparatus Grant 7,381,951 - Doi , et al. June 3, 2	2008-06-03
Method and apparatus for arranging recipe of scanning electron microscope and apparatus for evaluating shape of semiconductor device pattern Grant 7,365,322 - Miyamoto , et al. April 29, 2	2008-04-29
Method and apparatus for observing a specimen Grant 7,365,325 - Miyamoto , et al. April 29, 2	2008-04-29
Pattern matching method and computer program for executing pattern matching App 20080037830 - Sugiyama; Akiyuki ; et al.	2008-02-14
System and method for detecting a defect App 20080016481 - Matsuoka; Ryoichi ; et al.	2008-01-17
Workpiece size measurement method and apparatus App 20070221842 - Morokuma; Hidetoshi ; et al.	2007-09-27
Pattern matching method and pattern matching program App 20070223803 - Shindo; Hiroyuki ; et al.	2007-09-27
Scanning Electron Microscope And A Method For Imaging A Specimen Using The Same App 20070210252 - MIYAMOTO; Atsushi ; et al.	2007-09-13
Scanning electron microscope App 20070194234 - Nakada; Yoshinori ; et al.	2007-08-23
Method And Apparatus For Monitoring Cross-sectional Shape Of A Pattern Formed On A Semiconductor Device App 20070198955 - Nagatomo; Wataru ; et al.	2007-08-23
Image forming method and charged particle beam apparatus App 20070159662 - Kobaru; Atsushi ; et al.	2007-07-12
Method and apparatus for measuring three-dimensional shape of specimen by using SEM Grant 7,230,243 - Tanaka , et al. June 12, 2	2007-06-12
Apparatus for inspecting three dimensional shape of a specimen and method of watching an etching process using the same Grant 7,230,239 - Tanaka , et al. June 12, 2	2007-06-12
Method of measuring pattern dimension and method of controlling semiconductor device process App 20070120078 - Tanaka; Maki ; et al.	2007-05-31
Method and apparatus for observing a specimen App 20070114398 - Miyamoto; Atsushi ; et al.	2007-05-24
Scanning electron microscope Grant 7,217,925 - Nakada , et al. May 15, 2	2007-05-15
Method and apparatus for semiconductor device production process monitoring and method and apparatus for estimating cross sectional shape of a pattern App 20070105243 - Nagatomo; Wataru ; et al.	2007-05-10
Image forming method and charged particle beam apparatus Grant 7,187,345 - Kobaru , et al. March 6, 2	2007-03-06
Method of measuring pattern dimension and method of controlling semiconductor device process Grant 7,173,268 - Tanaka , et al. February 6, 2	2007-02-06
Image Forming Method And Charged Particle Beam Apparatus App 20070024528 - Kobaru; Atsushi ; et al.	2007-02-01
Method and apparatus for observing a specimen Grant 7,164,128 - Miyamoto , et al. January 16, 2	2007-01-16
Method and apparatus for measuring dimension of a pattern formed on a semiconductor wafer App 20060288325 - Miyamoto; Atsushi ; et al.	2006-12-21
Method and apparatus for arranging recipe of scanning electron microscope and apparatus for evaluating shape of semiconductor device pattern App 20060284081 - Miyamoto; Atsushi ; et al.	2006-12-21
Method and apparatus for measuring shape of a specimen App 20060210143 - Miyamoto; Atsushi ; et al.	2006-09-21
Pattern measuring method and pattern measuring device App 20060193508 - Sutani; Takumichi ; et al.	2006-08-31
Scanning electron microscope App 20060102840 - Nakada; Yoshinori ; et al.	2006-05-18
Scanning electron microscope App 20060097158 - Yamaguchi; Satoru ; et al.	2006-05-11
Scanning electron microscope Grant 7,009,178 - Nakada , et al. March 7, 2	2006-03-07
Charged particle beam adjustment method and apparatus App 20060043293 - Doi; Takashi ; et al.	2006-03-02
Scanning electron microscope Grant 7,002,151 - Yamaguchi , et al. February 21, 2	2006-02-21
Method and apparatus for measuring three-dimensional shape of specimen by using SEM App 20050285034 - Tanaka, Maki ; et al.	2005-12-29
Charged particle beam adjusting method and charged particle beam apparatus App 20050236570 - Morokuma, Hidetoshi ; et al.	2005-10-27
Method and apparatus for monitoring exposure process App 20050221207 - Nagatomo, Wataru ; et al.	2005-10-06
Scanning electron microscope App 20050178965 - Nakada, Yoshinori ; et al.	2005-08-18
Method of monitoring an exposure process Grant 6,929,892 - Shishido , et al. August 16, 2	2005-08-16
Method of observing exposure condition for exposing semiconductor device and its apparatus and method of manufacturing semiconductor device Grant 6,913,861 - Shishido , et al. July 5, 2	2005-07-05
Method and apparatus for observing a specimen App 20050133718 - Miyamoto, Atsushi ; et al.	2005-06-23
Method and system for monitoring a semiconductor device manufacturing process Grant 6,909,930 - Shishido , et al. June 21, 2	2005-06-21
Method of measuring pattern dimension and method of controlling semiconductor device process App 20050116182 - Tanaka, Maki ; et al.	2005-06-02
Scanning electron microscope App 20050109937 - Yamaguchi, Satoru ; et al.	2005-05-26
Scanning electron microscope Grant 6,897,445 - Nakada , et al. May 24, 2	2005-05-24
Apparatus for inspecting three dimensional shape of a specimen and method of watching an etching process using the same App 20050048780 - Tanaka, Maki ; et al.	2005-03-03
Method of monitoring an exposure process App 20050037271 - Shishido, Chie ; et al.	2005-02-17
Scanning electron microscope Grant 6,803,573 - Yamaguchi , et al. October 12, 2	2004-10-12
Process conditions change monitoring systems that use electron beams, and related monitoring methods Grant 6,791,096 - Komuro , et al. September 14, 2	2004-09-14
Process conditions change monitoring systems that use electron beams, and related monitoring methods Grant 6,791,082 - Komuro , et al. September 14, 2	2004-09-14
Scanning electron microscope App 20040094713 - Nakada, Yoshinori ; et al.	2004-05-20
Scanning electron microscope Grant 6,713,761 - Nakada , et al. March 30, 2	2004-03-30
Scanning electron microscope App 20040016882 - Yamaguchi, Satoru ; et al.	2004-01-29
Method of observing exposure condition for exposing semiconductor device and its apparatus and method of manufacturing semiconductor device App 20030219658 - Shishido, Chie ; et al.	2003-11-27
Scanning electron microscope Grant 6,627,888 - Yamaguchi , et al. September 30, 2	2003-09-30
Process conditions change monitoring systems that use electron beams, and related monitoring methods App 20030106999 - Komuro, Osamu ; et al.	2003-06-12
Process conditions change monitoring systems that use electron beams, and related monitoring methods App 20030038250 - Komuro, Osamu ; et al.	2003-02-27
Method and system for monitoring a semiconductor device manufacturing process App 20030015660 - Shishido, Chie ; et al.	2003-01-23
Scanning electron microscope App 20010054692 - Nakada, Yoshinori ; et al.	2001-12-27
Scanning electron microscope App 20010019109 - Yamaguchi, Satoru ; et al.	2001-09-06