Morita; Terumasa
Patent Applications and Registrations
Patent applications and USPTO patent grants for Morita; Terumasa.The latest application filed is for "measuring head and eccentricity measuring device including the same".
- Morita; Terumasa - Hachioji JP
- MORITA; Terumasa - Tokyo JP
- Morita, Terumasa - Hachioji-shi JP
- Morita; Terumasa - Hachiouji JP
| Patent | Date |
|---|---|
| Measuring head and eccentricity measuring device including the same Grant 10,175,041 - Adachi , et al. J | 2019-01-08 |
| Measuring Head And Eccentricity Measuring Device Including The Same App 20180017382 - ADACHI; Kanato ; et al. | 2018-01-18 |
| Microscope apparatus Grant 7,817,335 - Ryu , et al. October 19, 2 | 2010-10-19 |
| Light source apparatus and microscope apparatus Grant 7,764,424 - Yabe , et al. July 27, 2 | 2010-07-27 |
| Lens evaluation device Grant 7,747,101 - Matsuzawa , et al. June 29, 2 | 2010-06-29 |
| Microscope Apparatus App 20090219614 - Ryu; Go ; et al. | 2009-09-03 |
| Light source apparatus and microscope apparatus App 20070274634 - Yabe; Masato ; et al. | 2007-11-29 |
| Lens evaluation device App 20070115457 - Matsuzawa; Toshiaki ; et al. | 2007-05-24 |
| Laser machining apparatus App 20060289410 - Morita; Terumasa ; et al. | 2006-12-28 |
| Apparatus for inspecting a substrate Grant 6,707,546 - Okahira , et al. March 16, 2 | 2004-03-16 |
| Apparatus for inspecting a substrate Grant 6,671,041 - Okahira , et al. December 30, 2 | 2003-12-30 |
| Confocal microscope and height measurement method using the same Grant 6,580,518 - Eda , et al. June 17, 2 | 2003-06-17 |
| Apparatus for inspecting a substrate App 20020057429 - Okahira, Hiroyuki ; et al. | 2002-05-16 |
| Apparatus for inspecting a substrate Grant 6,362,884 - Okahira , et al. March 26, 2 | 2002-03-26 |
| Apparatus for inspecting a substrate App 20010002862 - Okahira, Hiroyuki ; et al. | 2001-06-07 |
| Fine surface profile measuring apparatus Grant 4,971,445 - Sato , et al. November 20, 1 | 1990-11-20 |
| Microscope apparatus for examining wafer Grant 4,832,474 - Yoshinaga , et al. May 23, 1 | 1989-05-23 |
| Microscope Grant 4,744,642 - Yoshinaga , et al. May 17, 1 | 1988-05-17 |
| Optical surface profile measuring device Grant 4,732,485 - Morita , et al. March 22, 1 | 1988-03-22 |
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