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Solid-state Imaging Device, Ad-converter Circuit And Current Compensation Circuit App 20220210364 - MORISHITA; Fukashi | 2022-06-30 |
Image sensor with A/D conversion circuit having reduced DNL deterioration Grant 11,115,614 - Iizuka , et al. September 7, 2 | 2021-09-07 |
Solid-state Imaging Device App 20200244908 - Kind Code | 2020-07-30 |
Semiconductor Device And Systems App 20200195871 - IIZUKA; Yoichi ;   et al. | 2020-06-18 |
Semiconductor device Grant 10,321,086 - Ueda , et al. | 2019-06-11 |
Solid-state imaging device Grant 10,257,457 - Matsumoto , et al. | 2019-04-09 |
Solid-state image sensing device and electronic device Grant 10,038,868 - Okura , et al. July 31, 2 | 2018-07-31 |
Solid-state Imaging Device App 20180152656 - MATSUMOTO; Osamu ;   et al. | 2018-05-31 |
Solid-state image pickup device with columns clustered into groups Grant 9,967,502 - Matsumoto , et al. May 8, 2 | 2018-05-08 |
Semiconductor Device App 20180007301 - UEDA; Kazuhiro ;   et al. | 2018-01-04 |
Semiconductor Device App 20170302875 - OKURA; Shunsuke ;   et al. | 2017-10-19 |
Semiconductor device including an imaging element Grant 9,769,410 - Ueda , et al. September 19, 2 | 2017-09-19 |
Semiconductor device Grant 9,716,851 - Okura , et al. July 25, 2 | 2017-07-25 |
Solid-state Image Sensing Device And Electronic Device App 20170118433 - OKURA; Shunsuke ;   et al. | 2017-04-27 |
Solid-state image sensing device and electronic device Grant 9,635,290 - Okura , et al. April 25, 2 | 2017-04-25 |
Content addressable memory with reduced power consumption and increased search operation speed Grant 9,620,214 - Watanabe , et al. April 11, 2 | 2017-04-11 |
Solid-state imaging apparatus and semiconductor device Grant 9,590,652 - Okura , et al. March 7, 2 | 2017-03-07 |
Analog to digital converter for solid-state image pickup device Grant 9,560,300 - Utsunomiya , et al. January 31, 2 | 2017-01-31 |
Solid-state image sensing device that performs an A/D conversion operation at high speed Grant 9,473,723 - Ueda , et al. October 18, 2 | 2016-10-18 |
Semiconductor Device App 20160248999 - UEDA; Kazuhiro ;   et al. | 2016-08-25 |
Solid-state Image Pickup Device App 20160249005 - MATSUMOTO; Osamu ;   et al. | 2016-08-25 |
Analog To Digital Converter For Solid-state Image Pickup Device App 20160212367 - UTSUNOMIYA; Hiroto ;   et al. | 2016-07-21 |
Analog to digital converter for solid-state image pickup device Grant 9,300,892 - Utsunomiya , et al. March 29, 2 | 2016-03-29 |
Semiconductor Device App 20150312506 - OKURA; Shunsuke ;   et al. | 2015-10-29 |
Solid-state Image Sensing Device And Electronic Device App 20150304578 - OKURA; Shunsuke ;   et al. | 2015-10-22 |
Solid-state Imaging Apparatus And Semiconductor Device App 20150236712 - OKURA; Shunsuke ;   et al. | 2015-08-20 |
Content Addressable Memory App 20150228341 - WATANABE; Naoya ;   et al. | 2015-08-13 |
Content addressable memory Grant 9,042,148 - Watanabe , et al. May 26, 2 | 2015-05-26 |
Solid-state imaging apparatus and semiconductor device Grant 9,041,580 - Okura , et al. May 26, 2 | 2015-05-26 |
Solid-state Image Sensing Device App 20150124138 - UEDA; Kazuhiro ;   et al. | 2015-05-07 |
Solid-state Imaging Apparatus And Semiconductor Device App 20140362273 - OKURA; Shunsuke ;   et al. | 2014-12-11 |
Analog To Digital Converter For Solid-state Image Pickup Device App 20140226049 - UTSUNOMIYA; Hiroto ;   et al. | 2014-08-14 |
Image sensor provided with plural pixel circuits arranged in plural rows and plural columns Grant 8,772,694 - Sugano , et al. July 8, 2 | 2014-07-08 |
Analog to digital converter for solid-state image pickup device Grant 8,736,732 - Utsunomiya , et al. May 27, 2 | 2014-05-27 |
Content Addressable Memory App 20140126264 - WATANABE; Naoya ;   et al. | 2014-05-08 |
Content addressable memory Grant 8,638,583 - Watanabe , et al. January 28, 2 | 2014-01-28 |
Semiconductor device including internal voltage generation circuit Grant 8,599,639 - Akiyama , et al. December 3, 2 | 2013-12-03 |
Semiconductor Device Including Internal Voltage Generation Circuit App 20130249624 - AKIYAMA; Mihoko ;   et al. | 2013-09-26 |
Semiconductor device Grant 8,466,718 - Ezumi , et al. June 18, 2 | 2013-06-18 |
Semiconductor device including internal voltage generation circuit Grant 8,451,678 - Akiyama , et al. May 28, 2 | 2013-05-28 |
Content Addressable Memory App 20130010513 - WATANABE; Naoya ;   et al. | 2013-01-10 |
Content addressable memory Grant 8,310,852 - Watanabe , et al. November 13, 2 | 2012-11-13 |
Content Addressable Memory App 20120170344 - WATANABE; Naoya ;   et al. | 2012-07-05 |
Semiconductor memory device Grant 8,188,534 - Morishita , et al. May 29, 2 | 2012-05-29 |
Image Sensor App 20120112039 - Sugano; Hiroki ;   et al. | 2012-05-10 |
Content addressable memory Grant 8,164,934 - Watanabe , et al. April 24, 2 | 2012-04-24 |
Semiconductor integrated circuit device Grant 8,154,271 - Morishita April 10, 2 | 2012-04-10 |
Semiconductor Device App 20110248749 - EZUMI; Yoshiyuki ;   et al. | 2011-10-13 |
Semiconductor Integrated Circuit Device App 20110221419 - Morishita; Fukashi | 2011-09-15 |
Semiconductor device Grant 8,014,224 - Yoshinaga , et al. September 6, 2 | 2011-09-06 |
Semiconductor device including internal voltage generation circuit Grant 8,004,923 - Akiyama , et al. August 23, 2 | 2011-08-23 |
Semiconductor Device Including Internal Voltage Generation Circuit App 20110182131 - Akiyama; Mihoko ;   et al. | 2011-07-28 |
Semiconductor integrated circuit device Grant 7,977,932 - Morishita July 12, 2 | 2011-07-12 |
Semiconductor Memory Device App 20110127609 - MORISHITA; Fukashi ;   et al. | 2011-06-02 |
Semiconductor memory device Grant 7,910,975 - Morishita , et al. March 22, 2 | 2011-03-22 |
Semiconductor integrated circuit device Grant 7,906,990 - Morishita March 15, 2 | 2011-03-15 |
Oscillator and charge pump circuit using the same Grant 7,804,368 - Kishida , et al. September 28, 2 | 2010-09-28 |
Solid-state Image Pickup Device App 20100231768 - Utsunomiya; Hiroto ;   et al. | 2010-09-16 |
Semiconductor Integrated Circuit Device App 20100188120 - Morishita; Fukashi | 2010-07-29 |
Semiconductor memory device Grant 7,764,540 - Morishita , et al. July 27, 2 | 2010-07-27 |
Content Addressable Memory App 20100165691 - WATANABE; Naoya ;   et al. | 2010-07-01 |
Semiconductor memory device Grant 7,738,312 - Shimano , et al. June 15, 2 | 2010-06-15 |
Semiconductor Device Including Internal Voltage Generation Circuit App 20100109761 - Akiyama; Mihoko ;   et al. | 2010-05-06 |
Solid State Imaging Device App 20100033609 - KATO; Hiroshi ;   et al. | 2010-02-11 |
Semiconductor device including internal voltage generation circuit Grant 7,656,736 - Akiyama , et al. February 2, 2 | 2010-02-02 |
Semiconductor memory device Grant 7,652,927 - Morishita , et al. January 26, 2 | 2010-01-26 |
Internal Voltage Generating Circuit And Semiconductor Integrated Circuit Device App 20090224823 - GYOHTEN; Takayuki ;   et al. | 2009-09-10 |
Semiconductor Device Including Detector Circuit Capable Of Performing High-speed Operation App 20090102544 - OKAMOTO; Mako ;   et al. | 2009-04-23 |
Semiconductor Integrated Circuit Device App 20090079407 - MORISHITA; Fukashi | 2009-03-26 |
Temperature detecting semiconductor device App 20090058543 - Gyoten; Takayuki ;   et al. | 2009-03-05 |
Semiconductor memory device and manufacturing method of the same Grant 7,498,207 - Hirose , et al. March 3, 2 | 2009-03-03 |
Semiconductor Memory Device App 20090022001 - Morishita; Fukashi ;   et al. | 2009-01-22 |
Semiconductor device including detector circuit capable of performing high-speed operation Grant 7,479,820 - Okamoto , et al. January 20, 2 | 2009-01-20 |
Semiconductor Device App 20090003091 - Yoshinaga; Kenji ;   et al. | 2009-01-01 |
Semiconductor Device Undergoing Defect Detection Test App 20080298156 - YOSHINAGA; Kenji ;   et al. | 2008-12-04 |
Temperature detecting semiconductor device Grant 7,459,983 - Gyoten , et al. December 2, 2 | 2008-12-02 |
Internal voltage generating circuit and semiconductor integrated circuit device Grant 7,456,680 - Gyohten , et al. November 25, 2 | 2008-11-25 |
Semiconductor Memory Device App 20080251860 - Morishita; Fukashi ;   et al. | 2008-10-16 |
Oscillator and charge pump circuit using the same App 20080252388 - Kishida; Masanobu ;   et al. | 2008-10-16 |
Semiconductor device Grant 7,430,149 - Yoshinaga , et al. September 30, 2 | 2008-09-30 |
Semiconductor device undergoing defect detection test Grant 7,408,818 - Yoshinaga , et al. August 5, 2 | 2008-08-05 |
Oscillator and charge pump circuit using the same Grant 7,397,315 - Kishida , et al. July 8, 2 | 2008-07-08 |
Semiconductor memory device App 20080137394 - Shimano; Hiroki ;   et al. | 2008-06-12 |
Semiconductor memory device and manufacturing method of the same App 20080023764 - Hirose; Masakazu ;   et al. | 2008-01-31 |
Semiconductor memory device and manufacturing method of the same App 20080023743 - Hirose; Masakazu ;   et al. | 2008-01-31 |
Internal voltage generating circuit and semiconductor integrated circuit device App 20070262812 - Gyohten; Takayuki ;   et al. | 2007-11-15 |
Semiconductor memory device App 20070263466 - Morishita; Fukashi ;   et al. | 2007-11-15 |
Semiconductor memory device and manufacturing method of the same Grant 7,291,538 - Hirose , et al. November 6, 2 | 2007-11-06 |
Content addressable memory App 20070247885 - Watanabe; Naoya ;   et al. | 2007-10-25 |
Semiconductor device including internal voltage generation circuit App 20070216467 - Akiyama; Mihoko ;   et al. | 2007-09-20 |
Semiconductor device undergoing defect detection test App 20070183214 - Yoshinaga; Kenji ;   et al. | 2007-08-09 |
Semiconductor device App 20070047365 - Yoshinaga; Kenji ;   et al. | 2007-03-01 |
Nonvolatile semiconductor memory device Grant 7,157,773 - Kato , et al. January 2, 2 | 2007-01-02 |
Semiconductor device App 20060285576 - Gyoten; Takayuki ;   et al. | 2006-12-21 |
Internal power supply voltage generation circuit that can suppress reduction in internal power supply voltage in neighborhood of lower limit region of external power supply voltage Grant 7,095,272 - Morishita August 22, 2 | 2006-08-22 |
Semiconductor integrated circuit with voltage adjusting circuit Grant 7,068,093 - Morishita , et al. June 27, 2 | 2006-06-27 |
Oscillator and charge pump circuit using the same App 20060132247 - Kishida; Masanobu ;   et al. | 2006-06-22 |
Semiconductor memory device with common I/O type circuit configuration achieving write before sense operation Grant 7,064,993 - Gyohten , et al. June 20, 2 | 2006-06-20 |
Semiconductor device App 20060103434 - Okamoto; Mako ;   et al. | 2006-05-18 |
Semiconductor device with multiple power sources Grant 7,030,681 - Yamazaki , et al. April 18, 2 | 2006-04-18 |
Semiconductor device having standby mode and active mode Grant 7,023,754 - Akiyama , et al. April 4, 2 | 2006-04-04 |
Semiconductor memory device and manufacturing method of the same App 20060024918 - Hirose; Masakazu ;   et al. | 2006-02-02 |
Internal power supply voltage generation circuit that can suppress reduction in internal power supply voltage in neighborhood of lower limit region of external power supply voltage App 20050280465 - Morishita, Fukashi | 2005-12-22 |
Internal voltage generating circuit and semiconductor integrated circuit device App 20050264347 - Gyohten, Takayuki ;   et al. | 2005-12-01 |
Semiconductor memory device and manufacturing method of the same Grant 6,965,148 - Hirose , et al. November 15, 2 | 2005-11-15 |
Internal power supply voltage generation circuit that can suppress reduction in internal power supply voltage in neighborhood of lower limit region of external power supply voltage Grant 6,963,230 - Morishita November 8, 2 | 2005-11-08 |
Semiconductor device Grant 6,914,300 - Hirose , et al. July 5, 2 | 2005-07-05 |
Semiconductor memory device allowing reduction of an area loss Grant 6,819,619 - Morishita , et al. November 16, 2 | 2004-11-16 |
Semiconductor memory device with common I/O type circuit configuration achieving write before sense operation App 20040213064 - Gyohten, Takayuki ;   et al. | 2004-10-28 |
Semiconductor device App 20040201062 - Hirose, Masakazu ;   et al. | 2004-10-14 |
Clock generating circuit Grant 6,781,431 - Taito , et al. August 24, 2 | 2004-08-24 |
Semiconductor integrated circuit with voltage down converter adaptable for burn-in testing Grant 6,777,707 - Akiyama , et al. August 17, 2 | 2004-08-17 |
Multi-power semiconductor integrated circuit device Grant 6,768,354 - Yamazaki , et al. July 27, 2 | 2004-07-27 |
Semiconductor memory device with circuit executing burn-in testing Grant 6,704,231 - Morishita , et al. March 9, 2 | 2004-03-09 |
Substrate bias voltage generating circuit Grant 6,700,434 - Fujii , et al. March 2, 2 | 2004-03-02 |
Semiconductor integrated circuit with voltage adjusting circuit App 20040027194 - Morishita, Fukashi ;   et al. | 2004-02-12 |
Semiconductor memory device allowing reduction of an area loss App 20040022114 - Morishita, Fukashi ;   et al. | 2004-02-05 |
Nonvolatile semiconductor memory device App 20040007734 - Kato, Hiroshi ;   et al. | 2004-01-15 |
Semiconductor device having standby mode and active mode App 20030234406 - Akiyama, Mihoko ;   et al. | 2003-12-25 |
Semiconductor memory device including internal power circuit having tuning function Grant 6,665,217 - Morishita , et al. December 16, 2 | 2003-12-16 |
Potential detecting circuit having wide operating margin and semiconductor device including the same Grant 6,614,270 - Okamoto , et al. September 2, 2 | 2003-09-02 |
Clock generating circuit App 20030117204 - Taito, Yasuhiko ;   et al. | 2003-06-26 |
Semiconductor memory device and manufacturing method of the same App 20030057488 - Hirose, Masakazu ;   et al. | 2003-03-27 |
Semiconductor device provided with potential transmission line App 20030025181 - Okamoto, Mako ;   et al. | 2003-02-06 |
Semiconductor memory device including internal power circuit having tuning function App 20030021162 - Morishita, Fukashi ;   et al. | 2003-01-30 |
Semiconductor integrated circuit with voltage down converter adaptable for burn-in testing App 20030020095 - Akiyama, Mihoko ;   et al. | 2003-01-30 |
Semiconductor device with multiple power sources App 20020171461 - Yamazaki, Akira ;   et al. | 2002-11-21 |
Internal voltage generation circuit Grant 6,472,926 - Taito , et al. October 29, 2 | 2002-10-29 |
Semiconductor memory device with internal power supply potential generation circuit Grant 6,424,579 - Akiyama , et al. July 23, 2 | 2002-07-23 |
Semiconductor integrated circuit device capable of stably generating internal voltage independent of an external power supply voltage Grant 6,424,134 - Morishita , et al. July 23, 2 | 2002-07-23 |
Semiconductor integrated circuit App 20020075064 - Fujii, Nobuyuki ;   et al. | 2002-06-20 |
Semiconductor device including internal potential generating circuit allowing tuning in short period of time and reduction of chip area App 20020064077 - Kobayashi, Mako ;   et al. | 2002-05-30 |
Semiconductor memory device with internal power supply potential genaration circuit App 20020060942 - Akiyama, Mihoko ;   et al. | 2002-05-23 |
Semiconductor Memory Provided With Data-line Equalizing Circuit App 20020051393 - Taito, Yasuhiko ;   et al. | 2002-05-02 |
Potential detecting circuit App 20020047731 - Okamoto, Mako ;   et al. | 2002-04-25 |
Semiconductor device reduced in through current App 20020047741 - Kato, Hiroshi ;   et al. | 2002-04-25 |
Clock generating circuit App 20020033725 - Taito, Yasuhiko ;   et al. | 2002-03-21 |
Constant Internal Voltage Generation Circuit App 20020030537 - Kobayashi, Mako ;   et al. | 2002-03-14 |
Internal power supply voltage generation circuit that can suppress reduction in internal power supply voltage in neighborhood of lower limit region of external power supply voltage App 20020030538 - Morishita, Fukashi | 2002-03-14 |
Voltage down converter allowing supply of stable internal power supply voltage App 20020027427 - Kinoshita, Mitsuya ;   et al. | 2002-03-07 |
Semiconductor device capable of generating internal voltage effectively App 20020027809 - Fujii, Nobuyuki ;   et al. | 2002-03-07 |
Semiconductor device allowing external setting of internal power supply voltage generated by a voltage down converter at the time of testing App 20020021602 - Morishita, Fukashi | 2002-02-21 |
Substrate bias voltage generating circuit App 20020017946 - Fujii, Nobuyuki ;   et al. | 2002-02-14 |
Semiconductor integrated circuit device capable of stably generating internal voltage App 20020011826 - Morishita, Fukashi ;   et al. | 2002-01-31 |
Multi-power semiconductor integrated circuit device App 20020011883 - Yamazaki, Akira ;   et al. | 2002-01-31 |
Voltage downconverter circuit capable of reducing current consumption while keeping response rate App 20020008502 - Akiyama, Mihoko ;   et al. | 2002-01-24 |
Internal Voltage generation circuit App 20020008566 - Taito, Yasuhiko ;   et al. | 2002-01-24 |
Semiconductor device including voltage down converter allowing tuning in short period of time and reduction of chip area App 20020000582 - Kobayashi, Mako ;   et al. | 2002-01-03 |
Voltage converting circuit allowing control of current drivability in accordance with operational frequency Grant 6,333,669 - Kobayashi , et al. December 25, 2 | 2001-12-25 |
Semiconductor device including voltage down converter allowing tuning in short period of time and reduction of chip area Grant 6,331,962 - Kobayashi , et al. December 18, 2 | 2001-12-18 |
Semiconductor Memory Device Capable Of Performing Stable Operation For Noise While Preventing Increase In Chip Area App 20010045583 - MORISHITA, FUKASHI ;   et al. | 2001-11-29 |
Negative voltage generating circuit with high control responsiveness which can be formed using transistor with low breakdown voltage and semiconductor memory device including the same App 20010017812 - Morishita, Fukashi | 2001-08-30 |
Semiconductor memory device Grant 6,272,034 - Kinoshita , et al. August 7, 2 | 2001-08-07 |
Negative voltage generating circuit with high control responsiveness which can be formed using transistor with low breakdown voltage and semiconductor memory device including the same Grant 6,246,280 - Morishita June 12, 2 | 2001-06-12 |
Internal power supply voltage generation circuit that can suppress reduction in internal power supply voltage in neighborhood of lower limit region of external power supply voltage App 20010000655 - Morishita, Fukashi | 2001-05-03 |
High speed operable semiconductor memory device with memory blocks arranged about the center Grant 6,215,720 - Amano , et al. April 10, 2 | 2001-04-10 |
Semiconductor memory device Grant 6,081,443 - Morishita , et al. June 27, 2 | 2000-06-27 |
High speed operable semiconductor memory device with memory blocks arranged about the center Grant 6,072,743 - Amano , et al. June 6, 2 | 2000-06-06 |
Multi-bank clock synchronous type semiconductor memory device having improved memory array and power supply arrangement Grant 6,064,621 - Tanizaki , et al. May 16, 2 | 2000-05-16 |
SOI input protection circuit Grant 6,046,476 - Morishita , et al. April 4, 2 | 2000-04-04 |
Semiconductor device allowing external setting of internal power supply voltage generated by a voltage down converter at the time of testing Grant 6,038,189 - Morishita March 14, 2 | 2000-03-14 |
Semiconductor memory device capable of increasing chip yields while maintaining rapid operation Grant 5,914,907 - Kobayashi , et al. June 22, 1 | 1999-06-22 |
Semiconductor memory device Grant 5,877,978 - Morishita , et al. March 2, 1 | 1999-03-02 |
Semiconductor memory device and semiconductor device Grant 5,867,418 - Okasaka , et al. February 2, 1 | 1999-02-02 |
SOI input protection circuit Grant 5,841,172 - Morishita , et al. November 24, 1 | 1998-11-24 |
Constant current generating circuit Grant 5,757,175 - Morishita , et al. May 26, 1 | 1998-05-26 |
Semiconductor memory device and semiconductor device Grant 5,708,610 - Okasaka , et al. January 13, 1 | 1998-01-13 |
Semiconductor integrated circuit device having a test mode for reliability evaluation Grant 5,694,364 - Morishita , et al. December 2, 1 | 1997-12-02 |