Morishige; Yoshio

Patent Applications and Registrations

Patent applications and USPTO patent grants for Morishige; Yoshio.The latest application filed is for "method of inspecting a semiconductor device and an apparatus thereof".

Company Profile

0.23.15

Morishige; Yoshio - Honjyou N/A JP
Morishige; Yoshio - Honjo N/A JP
Morishige; Yoshio - Honjo-shi JP
Morishige; Yoshio - Saitama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of inspecting a semiconductor device and an apparatus thereof Grant 8,559,000 - Hamamatsu , et al. October 15, 2	2013-10-15
Foreign matter inspection method and foreign matter inspection apparatus Grant 8,422,009 - Yamashita , et al. April 16, 2	2013-04-16
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20120312104 - HAMAMATSU; Akira ; et al.	2012-12-13
Method of inspecting a semiconductor device and an apparatus thereof Grant 8,274,651 - Hamamatsu , et al. September 25, 2	2012-09-25
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20120006131 - Hamamatsu; Akira ; et al.	2012-01-12
Foreign Matter Inspection Method And Foreign Matter Inspection Apparatus App 20110267605 - Yamashita; Hiroyuki ; et al.	2011-11-03
Method of inspecting a semiconductor device and an apparatus thereof Grant 8,040,503 - Hamamatsu , et al. October 18, 2	2011-10-18
Foreign matter inspection method and foreign matter inspection apparatus Grant 7,986,405 - Yamashita , et al. July 26, 2	2011-07-26
Method of detecting defects on an object Grant 7,940,383 - Noguchi , et al. May 10, 2	2011-05-10
Foreign Matter Inspection Method And Foreign Matter Inspection Apparatus App 20100195095 - YAMASHITA; Hiroyuki ; et al.	2010-08-05
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20100140474 - HAMAMATSU; Akira ; et al.	2010-06-10
Foreign matter inspection method and foreign matter inspection apparatus Grant 7,719,671 - Yamashita , et al. May 18, 2	2010-05-18
Apparatus And Method For Testing Defects App 20100088042 - NOGUCHI; Minori ; et al.	2010-04-08
Apparatus and method for testing defects Grant 7,692,779 - Noguchi , et al. April 6, 2	2010-04-06
Method of inspecting a semiconductor device and an apparatus thereof Grant 7,643,138 - Hamamatsu , et al. January 5, 2	2010-01-05
Apparatus and method for testing defects Grant 7,639,350 - Noguchi , et al. December 29, 2	2009-12-29
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20080291437 - Hamamatsu; Akira ; et al.	2008-11-27
Apparatus and method for testing defects Grant 7,443,496 - Noguchi , et al. October 28, 2	2008-10-28
Method of inspecting a semiconductor device and an apparatus thereof Grant 7,417,723 - Hamamatsu , et al. August 26, 2	2008-08-26
Foreign matter inspection method and foreign matter inspection apparatus App 20070201019 - Yamashita; Hiroyuki ; et al.	2007-08-30
Apparatus And Method For Testing Defects App 20070146697 - Noguchi; Minori ; et al.	2007-06-28
Apparatus And Method For Testing Defects App 20070146696 - Noguchi; Minori ; et al.	2007-06-28
Method of inspecting a semiconductor device and an apparatus thereof App 20060215153 - Hamamatsu; Akira ; et al.	2006-09-28
Apparatus and method for testing defects Grant 7,098,055 - Noguchi , et al. August 29, 2	2006-08-29
Method of inspecting a semiconductor device and an apparatus thereof Grant 7,061,602 - Hamamatsu , et al. June 13, 2	2006-06-13
Apparatus and method for testing defects Grant 7,037,735 - Noguchi , et al. May 2, 2	2006-05-02
Apparatus and method for testing defects App 20060030060 - Noguchi; Minori ; et al.	2006-02-09
Apparatus and method for testing defects App 20060030059 - Noguchi; Minori ; et al.	2006-02-09
Method of inspecting a semiconductor device and an apparatus thereof App 20050196033 - Hamamatsu, Akira ; et al.	2005-09-08
Method of inspecting a semiconductor device and an apparatus thereof Grant 6,888,959 - Hamamatsu , et al. May 3, 2	2005-05-03
Optical apparatus for defect and particle size inspection Grant 6,411,377 - Noguchi , et al. June 25, 2	2002-06-25
Method of inspecting a semiconductor device and an apparatus thereof App 20010048761 - Hamamatsu, Akira ; et al.	2001-12-06
Extraneous substance inspection apparatus for patterned wafer Grant 5,818,576 - Morishige , et al. October 6, 1	1998-10-06
Extraneous substance inspection apparatus for patterned wafer Grant 5,724,132 - Morishige , et al. March 3, 1	1998-03-03
Surface inspection method and apparatus Grant 5,694,214 - Watanabe , et al. December 2, 1	1997-12-02
Extraneous substance inspection method and apparatus Grant 5,644,393 - Nakamura , et al. July 1, 1	1997-07-01

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