Morillo; Jaime D.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Morillo; Jaime D..The latest application filed is for "fabrication of lithographic image fields using a proximity stitch metrology".

Company Profile

0.10.9

Morillo; Jaime D. - Beacon NY US
Morillo; Jaime D. - Cedar Park TX
Morillo; Jaime D. - Wappingers Falls NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Target and method for mask-to-wafer CD, pattern placement and overlay measurement and control Grant 9,097,989 - Ausschnitt , et al. August 4, 2	2015-08-04
Fabrication of lithographic image fields using a proximity stitch metrology Grant 9,087,740 - Ausschnitt , et al. July 21, 2	2015-07-21
Fabrication Of Lithographic Image Fields Using A Proximity Stitch Metrology App 20150162249 - Ausschnitt; Christopher P. ; et al.	2015-06-11
Multilayer alignment and overlay target and measurement method Grant 8,339,605 - Ausschnitt , et al. December 25, 2	2012-12-25
Multi layer alignment and overlay target and measurement method Grant 8,107,079 - Ausschnitt , et al. January 31, 2	2012-01-31
Multilayer Alignment And Overlay Target And Measurement Method App 20110069314 - Ausschnitt; Christopher P. ; et al.	2011-03-24
Multi Layer Alignment And Overlay Target And Measurement Method App 20110058170 - Ausschnitt; Christopher P. ; et al.	2011-03-10
Multi layer alignment and overlay target and measurement method Grant 7,876,439 - Ausschnitt , et al. January 25, 2	2011-01-25
Target And Method For Mask-to-wafer Cd, Pattern Placement And Overlay Measurement And Control App 20100190096 - Ausschnitt; Christopher P. ; et al.	2010-07-29
Overlay target and measurement method using reference and sub-grids Grant 7,626,702 - Ausschnitt , et al. December 1, 2	2009-12-01
Multi-layer alignment and overlay target and measurement method Grant 7,474,401 - Ausschnitt , et al. January 6, 2	2009-01-06
Multi Layer Alignment And Overlay Target And Measurement Method App 20080259334 - Ausschnitt; Christopher P. ; et al.	2008-10-23
Overlay Target And Measurement Method Using Reference And Sub-grids App 20080144031 - Ausschnitt; Christopher P. ; et al.	2008-06-19
Overlay target and measurement method using reference and sub-grids Grant 7,359,054 - Ausschnitt , et al. April 15, 2	2008-04-15
Multi-layer Alignment and Overlay Target and Measurement Method App 20070058169 - Ausschnitt; Christopher P. ; et al.	2007-03-15
Overlay target and measurement method using reference and sub-grids App 20050231722 - Ausschnitt, Christopher P. ; et al.	2005-10-20
Overlay target and measurement method using reference and sub-grids Grant 6,937,337 - Ausschnitt , et al. August 30, 2	2005-08-30
Overlay Target And Measurement Method Using Reference And Sub-grids App 20050105092 - Ausschnitt, Christopher P. ; et al.	2005-05-19

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