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Vehicle headrest
Grant 10,486,570 - Hayashi , et al. Nov | 2019-11-26 |
Semiconductor device and semiconductor system
Grant 10,361,746 - Mori | 2019-07-23 |
Semiconductor Device And Semiconductor System
App 20190199391 - MORI; Hisaya | 2019-06-27 |
Vehicle headrest
Grant 10,279,718 - Hayashi , et al. | 2019-05-07 |
Vehicle Headrest
App 20180257533 - HAYASHI; Koji ; et al. | 2018-09-13 |
Vehicle Headrest
App 20180251055 - HAYASHI; Koji ; et al. | 2018-09-06 |
Seat configuration member and vehicle seat employing the seat configuration member
Grant 9,616,791 - Awata , et al. April 11, 2 | 2017-04-11 |
Vehicle seat and seat back board
Grant 9,505,329 - Mori , et al. November 29, 2 | 2016-11-29 |
Vehicle seat and resin seatback spring
Grant 9,108,552 - Awata , et al. August 18, 2 | 2015-08-18 |
Vehicle seat and seat back board
Grant 9,073,467 - Awata , et al. July 7, 2 | 2015-07-07 |
Seat backboard and vehicle seat
Grant 8,979,204 - Awata , et al. March 17, 2 | 2015-03-17 |
Vehicle Seat And Resin Seatback Spring
App 20140225352 - Awata; Shinji ; et al. | 2014-08-14 |
Seat Backboard And Vehicle Seat
App 20140084661 - Awata; Shinji ; et al. | 2014-03-27 |
Seat Configuration Member And Vehicle Seat Employing The Seat Configuration Member
App 20140070594 - Awata; Shinji ; et al. | 2014-03-13 |
Vehicle Seat And Seat Back Board
App 20140049090 - Mori; Hisaya ; et al. | 2014-02-20 |
Vehicle Seat And Seat Back Board
App 20130134749 - Awata; Shinji ; et al. | 2013-05-30 |
Vehicle seats
Grant 7,963,595 - Ito , et al. June 21, 2 | 2011-06-21 |
Air conditioning seat
Grant 7,931,330 - Itou , et al. April 26, 2 | 2011-04-26 |
Vehicle Seats
App 20090295200 - ITO; Hidehiro ; et al. | 2009-12-03 |
Air Conditioning Seat
App 20090079236 - ITOU; Hidehiro ; et al. | 2009-03-26 |
Test circuit for evaluating characteristic of analog signal of device
Grant 7,079,060 - Tarui , et al. July 18, 2 | 2006-07-18 |
Apparatus for testing semiconductor integrated circuit
Grant 7,058,865 - Mori , et al. June 6, 2 | 2006-06-06 |
Data storage apparatus and data measuring apparatus
Grant 6,990,614 - Nagasawa , et al. January 24, 2 | 2006-01-24 |
Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal
Grant 6,934,648 - Hanai , et al. August 23, 2 | 2005-08-23 |
Test circuit for evaluating characteristic of analog signal of device
App 20050179576 - Tarui, Toshiaki ; et al. | 2005-08-18 |
Apparatus and method for testing semiconductor integrated circuit
Grant 6,900,627 - Mori , et al. May 31, 2 | 2005-05-31 |
Apparatus for testing semiconductor integrated circuit
App 20040177302 - Mori, Hisaya ; et al. | 2004-09-09 |
Apparatus for testing semiconductor integrated circuit
Grant 6,714,888 - Mori , et al. March 30, 2 | 2004-03-30 |
Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal
App 20040044488 - Hanai, Hisayoshi ; et al. | 2004-03-04 |
Apparatus and method for testing semiconductor integrated circuit
Grant 6,690,189 - Mori , et al. February 10, 2 | 2004-02-10 |
Tester for semiconductor integrated circuits
Grant 6,661,248 - Mori , et al. December 9, 2 | 2003-12-09 |
External test auxiliary device to be used for testing semiconductor device
Grant 6,653,855 - Mori , et al. November 25, 2 | 2003-11-25 |
Semiconductor test apparatus, and method of testing semiconductor device
Grant 6,651,023 - Mori , et al. November 18, 2 | 2003-11-18 |
Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits
Grant 6,642,736 - Mori , et al. November 4, 2 | 2003-11-04 |
Threshold analysis system capable of deciding all threshold voltages included in memory device through single processing
Grant 6,634,004 - Yamada , et al. October 14, 2 | 2003-10-14 |
Apparatus and method for testing semiconductor integrated circuit
Grant 6,628,137 - Mori , et al. September 30, 2 | 2003-09-30 |
Semiconductor test apparatus and method
Grant 6,587,975 - Mori , et al. July 1, 2 | 2003-07-01 |
Semiconductor Test Apparatus And Method
App 20030070121 - MORI, HISAYA ; et al. | 2003-04-10 |
Tester for semiconductor integrated circuits
App 20030048112 - Mori, Hisaya ; et al. | 2003-03-13 |
External test auxiliary device to be used for testing semiconductor device
App 20020118007 - Mori, Hisaya ; et al. | 2002-08-29 |
Apparatus and method for testing semiconductor integrated circuit
App 20020118017 - Mori, Hisaya ; et al. | 2002-08-29 |
Apparatus and method for testing semiconductor integrated circuit
App 20020105352 - Mori, Hisaya ; et al. | 2002-08-08 |
External Test Ancillary Device To Be Used For Testing Semiconductor Device, And Method Of Testing Semiconductor Device Using The Device
App 20020105353 - Mori, Hisaya ; et al. | 2002-08-08 |
Apparatus and method for testing semiconductor integrated circuit
App 20020108080 - Mori, Hisaya ; et al. | 2002-08-08 |
Semiconductor test apparatus, and method of testing semiconductor device
App 20020106817 - Mori, Hisaya ; et al. | 2002-08-08 |
Apparatus for testing semiconductor integrated circuit
App 20020107654 - Mori, Hisaya ; et al. | 2002-08-08 |
Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits
App 20020062200 - Mori, Hisaya ; et al. | 2002-05-23 |
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