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name:-0.016214847564697
name:-0.012259006500244
name:-0.0022671222686768
Mori; Chikaomi Patent Filings

Mori; Chikaomi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mori; Chikaomi.The latest application filed is for "probe guide, probe card, and method for probe guide manufacturing".

Company Profile
2.11.13
  • Mori; Chikaomi - Hyogo JP
  • Mori; Chikaomi - Amagasaki JP
  • Mori; Chikaomi - Amagasaki-shi JP
  • Mori; Chikaomi - Yamaga JP
  • Mori; Chikaomi - Yamaga-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Probe card case and probe card transfer method
Grant 10,908,180 - Mori , et al. February 2, 2
2021-02-02
Probe guide plate having a silicon oxide layer formed on surfaces and on an inner wall of a through hole thereof, and a protective insulating layer formed on the silicon oxide layer, and probe apparatus including the probe guide plate
Grant 10,261,110 - Shimizu , et al.
2019-04-16
Probe card case and probe card transfer method
Grant 10,184,954 - Mori , et al. Ja
2019-01-22
Probe guide, probe card, and method for probe guide manufacturing
Grant 10,139,430 - Mori , et al. Nov
2018-11-27
Probe Guide, Probe Card, And Method For Probe Guide Manufacturing
App 20170242057 - Mori; Chikaomi ;   et al.
2017-08-24
Probe Card Case And Probe Card Transfer Method
App 20170153272 - Mori; Chikaomi ;   et al.
2017-06-01
Probe Guide Plate And Probe Apparatus
App 20170146569 - Shimizu; Yuichiro ;   et al.
2017-05-25
Probe card case
Grant D751,555 - Mori , et al. March 15, 2
2016-03-15
Probe Card Case And Probe Card Transfer Method
App 20150285838 - Mori; Chikaomi ;   et al.
2015-10-08
Probe
App 20110291685 - Mori; Chikaomi
2011-12-01
Probe card
Grant 7,307,435 - Mori December 11, 2
2007-12-11
Probe card and contactor of the same
Grant 7,106,080 - Mori , et al. September 12, 2
2006-09-12
Probe card for examining semiconductor devices on semiconductor wafers
Grant 7,081,766 - Satou , et al. July 25, 2
2006-07-25
Probe card having a coil spring interposed between a support member and a contactor unit
Grant 7,075,319 - Mori July 11, 2
2006-07-11
Probe card and contactor of the same
App 20060076966 - Mori; Chikaomi ;   et al.
2006-04-13
Probe card
App 20060061375 - Mori; Chikaomi
2006-03-23
Probe card and contactor of the same
Grant 6,967,493 - Mori , et al. November 22, 2
2005-11-22
Connection pin
App 20050093559 - Mori, Chikaomi ;   et al.
2005-05-05
Probe card and contactor of the same
App 20050083072 - Mori, Chikaomi ;   et al.
2005-04-21
Apparatus for connecting between substrates
Grant 6,836,024 - Mori , et al. December 28, 2
2004-12-28
Probe card
App 20040257098 - Satou, Katsuhiko ;   et al.
2004-12-23
Apparatus For Connecting Between Substrates
App 20040222535 - Mori, Chikaomi ;   et al.
2004-11-11
Probe card
App 20040104738 - Mori, Chikaomi
2004-06-03
Method for producing a probe, mask for producing the probe, and probe
App 20030234657 - Mori, Chikaomi
2003-12-25

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