Morath; Christopher

Patent Applications and Registrations

Patent applications and USPTO patent grants for Morath; Christopher.The latest application filed is for "metrology system with spectroscopic ellipsometer and photoacoustic measurements".

Company Profile

0.6.6

Morath; Christopher - Morristown NJ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Metrology system with spectroscopic ellipsometer and photoacoustic measurements Grant 7,705,974 - Wolf , et al. April 27, 2	2010-04-27
Metrology system with spectroscopic ellipsometer and photoacoustic measurements App 20090201502 - Wolf; Robert Gregory ; et al.	2009-08-13
Metrology system with spectroscopic ellipsometer and photoacoustic measurements Grant 7,522,272 - Wolf , et al. April 21, 2	2009-04-21
Metrology system with spectroscopic ellipsometer and photoacoustic measurements App 20070268478 - Wolf; Robert Gregory ; et al.	2007-11-22
Metrology system with spectroscopic ellipsometer and photoacoustic measurements Grant 7,253,887 - Wolf , et al. August 7, 2	2007-08-07
Metrology system with spectroscopic ellipsometer and photoacoustic measurements App 20060126057 - Wolf; Robert Gregory ; et al.	2006-06-15
Method and apparatus for increasing signal to noise ratio in a photoacoustic film thickness measurement system Grant 7,050,178 - Morath , et al. May 23, 2	2006-05-23
Metrology system with spectroscopic ellipsometer and photoacoustic measurements Grant 7,006,221 - Wolf , et al. February 28, 2	2006-02-28
Metrology system with spectroscopic ellipsometer and photoacoustic measurements App 20030076497 - Wolf, Robert Gregory ; et al.	2003-04-24
Method and apparatus for increasing signal to noise ratio in a photoacoustic film thickness measurement system App 20030020929 - Morath, Christopher ; et al.	2003-01-30
Method and apparatus for decreasing thermal loading and roughness sensitivity in a photoacoustic film thickness measurement system Grant 6,504,618 - Morath , et al. January 7, 2	2003-01-07
Method and apparatus for decreasing thermal loading and roughness sensitivity in a photoacoustic film thickness measurement system App 20020135784 - Morath, Christopher ; et al.	2002-09-26

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