Montrose; Charles J.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Montrose; Charles J..The latest application filed is for "memory tester design for soft error rate (ser) failure analysis".

Company Profile

0.13.10

Montrose; Charles J. - Clintondale NY
Montrose; Charles J. - Hopewell Junction NY US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Voltage-driven intelligent characterization bench for semiconductor Grant 9,772,371 - Montrose , et al. September 26, 2	2017-09-26
Memory tester design for soft error rate (SER) failure analysis Grant 9,460,814 - Dragula , et al. October 4, 2	2016-10-04
Memory Tester Design For Soft Error Rate (ser) Failure Analysis App 20150318059 - Dragula; Joshua M. ; et al.	2015-11-05
Voltage-driven Intelligent Characterization Bench For Semiconductor App 20150185277 - Montrose; Charles J. ; et al.	2015-07-02
Voltage-driven intelligent characterization bench for semiconductor Grant 9,043,179 - Montrose , et al. May 26, 2	2015-05-26
Radiation hardened memory cell and design structures Grant 9,006,827 - Massey , et al. April 14, 2	2015-04-14
Voltage driver for a voltage-driven intelligent characterization bench for semiconductor Grant 8,615,373 - Montrose December 24, 2	2013-12-24
Radiation Hardened Memory Cell And Design Structures App 20130113043 - MASSEY; John G. ; et al.	2013-05-09
Method For Information Transfer In A Voltage-driven Intelligent Characterization Bench For Semiconductor App 20120179943 - Montrose; Charles J. ; et al.	2012-07-12
Voltage Driver For A Voltage-driven Intelligent Characterization Bench For Semiconductor App 20120179410 - Montrose; Charles J.	2012-07-12
Voltage-driven Intelligent Characterization Bench For Semiconductor App 20120179409 - Montrose; Charles J. ; et al.	2012-07-12
Apparatus for accurate and efficient quality and reliability evaluation of micro electromechanical systems Grant 7,602,265 - Deligianni , et al. October 13, 2	2009-10-13
Apparatus For Accurate And Efficient Quality And Reliability Evaluation Of Micro Electromechanical Systems App 20070090902 - Deligianni; Hariklia ; et al.	2007-04-26
Method and apparatus for testing a micro electromechanical device Grant 6,940,285 - Montrose , et al. September 6, 2	2005-09-06
Method And Apparatus For Testing A Micro Electromechanical Device App 20040257086 - Montrose, Charles J. ; et al.	2004-12-23
Stress testing for semiconductor devices Grant 6,611,146 - Montrose August 26, 2	2003-08-26
Electromigration and extrusion monitor and control system Grant 6,598,182 - Lowitz , et al. July 22, 2	2003-07-22
Stress testing for semiconductor devices App 20030001585 - Montrose, Charles J.	2003-01-02
Power booster and current measuring unit Grant 6,429,641 - Montrose August 6, 2	2002-08-06

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