Monshouwer; Rene

Patent Applications and Registrations

Patent applications and USPTO patent grants for Monshouwer; Rene.The latest application filed is for "method for producing a marker on a substrate, lithographic apparatus and device manufacturing method".

Company Profile

0.10.10

Monshouwer; Rene - Leiden NL
Monshouwer; Rene - Eindhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for producing a marker on a substrate, lithographic apparatus and device manufacturing method Grant 8,264,664 - Van Der Schaar , et al. September 11, 2	2012-09-11
Method and apparatus for measuring the relative position of a first and a second alignment mark Grant 7,633,618 - Monshouwer December 15, 2	2009-12-15
Method For Producing A Marker On A Substrate, Lithographic Apparatus And Device Manufacturing Method App 20090066921 - Van Der Schaar; Maurits ; et al.	2009-03-12
Method for producing a marker on a substrate, lithographic apparatus and device manufacturing method Grant 7,476,490 - Van Der Schaar , et al. January 13, 2	2009-01-13
Lithographic alignment system and device manufacturing method Grant 7,345,739 - Hendriks , et al. March 18, 2	2008-03-18
Lithographic apparatus and device manufacturing method Grant 7,312,846 - Neijzen , et al. December 25, 2	2007-12-25
Method of measuring overlay Grant 7,277,185 - Monshouwer , et al. October 2, 2	2007-10-02
Method of measuring alignment of a substrate with respect to a reference alignment mark Grant 7,095,499 - Monshouwer , et al. August 22, 2	2006-08-22
Method for producing a marker on a substrate, lithographic apparatus and device manufacturing method App 20060008714 - Van Der Schaar; Maurits ; et al.	2006-01-12
Method of measuring alignment of a substrate with respect to a reference alignment mark App 20050231698 - Monshouwer, Rene ; et al.	2005-10-20
Method of measuring overlay App 20050231732 - Monshouwer, Rene ; et al.	2005-10-20
Method of measuring alignment of a substrate with respect to a reference alignment mark Grant 6,937,334 - Monshouwer , et al. August 30, 2	2005-08-30
Method of measuring overlay Grant 6,937,344 - Monshouwer , et al. August 30, 2	2005-08-30
Method and apparatus for measuring the relative position of a first and a second alignment mark App 20050123844 - Monshouwer, Rene	2005-06-09
Lithographic alignment system and device manufacturing method App 20050110965 - Hendriks, Robert Frans Maria ; et al.	2005-05-26
Lithographic apparatus and device manufacturing method App 20050012915 - Neijzen, Jacobus Hermanus Maria ; et al.	2005-01-20
Lithographic apparatus and device manufacturing method Grant 6,803,993 - Neijzen , et al. October 12, 2	2004-10-12
Lithographic apparatus and device manufacturing method App 20030123035 - Neijzen, Jacobus Hermanus Maria ; et al.	2003-07-03
Method of measuring overlay App 20020080364 - Monshouwer, Rene ; et al.	2002-06-27
Method of measuring alignment of a substrate with respect to a reference alignment mark App 20020080365 - Monshouwer, Rene ; et al.	2002-06-27

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