Momonoi; Yoshinori
Patent Applications and Registrations
Patent applications and USPTO patent grants for Momonoi; Yoshinori.The latest application filed is for "charged particle beam apparatus".
- Momonoi; Yoshinori - Tokyo JP
- Momonoi; Yoshinori - Tachikawa JP
- Momonoi; Yoshinori - Clifton Park NY US
- Momonoi; Yoshinori - Kokubunji JP
| Patent | Date |
|---|---|
| Charged particle beam apparatus Grant 10,714,304 - Fukuda , et al. | 2020-07-14 |
| Charged particle beam apparatus Grant 10,665,420 - Takasugi , et al. | 2020-05-26 |
| Charged particle beam device Grant 10,546,715 - Hoque , et al. Ja | 2020-01-28 |
| Measurement device, calibration method of measurement device, and calibration member Grant 10,438,771 - Hatano , et al. O | 2019-10-08 |
| Charged Particle Beam Apparatus App 20190304740 - FUKUDA; Muneyuki ; et al. | 2019-10-03 |
| Charged Particle Beam Apparatus App 20190295815 - TAKASUGI; Yasunori ; et al. | 2019-09-26 |
| Charged particle beam apparatus Grant 10,340,115 - Fukuda , et al. | 2019-07-02 |
| Charged particle beam apparatus Grant 10,217,604 - Sakakibara , et al. Feb | 2019-02-26 |
| Scanning electron microscope Grant 10,186,399 - Osaki , et al. Ja | 2019-01-22 |
| Height measurement device and charged particle beam device Grant 10,101,150 - Kawada , et al. October 16, 2 | 2018-10-16 |
| Charged Particle Beam Apparatus App 20180286629 - SAKAKIBARA; Makoto ; et al. | 2018-10-04 |
| Charged Particle Beam Device App 20180269026 - HOQUE; Shahedul ; et al. | 2018-09-20 |
| Charged Particle Beam Apparatus App 20180138010 - FUKUDA; Muneyuki ; et al. | 2018-05-17 |
| Charged particle beam apparatus Grant 9,892,887 - Fukuda , et al. February 13, 2 | 2018-02-13 |
| Height Measurement Device and Charged Particle Beam Device App 20170343340 - KAWADA; Hiroki ; et al. | 2017-11-30 |
| Scanning Electron Microscope App 20170301513 - OSAKI; Mayuka ; et al. | 2017-10-19 |
| Charged Particle Beam Apparatus App 20170110285 - FUKUDA; Muneyuki ; et al. | 2017-04-20 |
| Measurement Device, Calibration Method Of Measurement Device, And Calibration Member App 20170092462 - HATANO; Michio ; et al. | 2017-03-30 |
| Pattern measuring apparatus, pattern measuring method, and computer-readable recording medium on which a pattern measuring program is recorded Grant 9,521,372 - Momonoi , et al. December 13, 2 | 2016-12-13 |
| Scanning electron microscope Grant 9,472,376 - Yokosuka , et al. October 18, 2 | 2016-10-18 |
| Semiconductor inspection device and semiconductor inspection method using the same Grant 9,123,504 - Yamaguchi , et al. September 1, 2 | 2015-09-01 |
| Scanning Electron Microscope App 20150008322 - Yokosuka; Toshiyuki ; et al. | 2015-01-08 |
| Pattern Measuring Apparatus, Pattern Measuring Method, And Computer-readable Recording Medium On Which A Pattern Measuring Program Is Recorded App 20130321610 - Momonoi; Yoshinori ; et al. | 2013-12-05 |
| Apparatus for evaluating degradation of pattern features Grant 8,401,273 - Momonoi , et al. March 19, 2 | 2013-03-19 |
| Semiconductor Inspection Device And Semiconductor Inspection Method Using The Same App 20120098954 - Yamaguchi; Atsuko ; et al. | 2012-04-26 |
| Apparatus For Evaluating Degradation Of Pattern Features App 20110176718 - MOMONOI; Yoshinori ; et al. | 2011-07-21 |
| Manufacturing method for semiconductor devices Grant 6,977,229 - Yokogawa , et al. December 20, 2 | 2005-12-20 |
| Method for manufacturing semiconductor device Grant 6,713,401 - Yokogawa , et al. March 30, 2 | 2004-03-30 |
| Manufacturing method for semiconductor devices App 20040018727 - Yokogawa, Kenetsu ; et al. | 2004-01-29 |
| Apparatus for cleaning semiconductor wafers in a vacuum environment Grant 6,643,893 - Momonoi , et al. November 11, 2 | 2003-11-11 |
| Method for cleaning semiconductor wafers in a vacuum environment Grant 6,629,538 - Yokogawa , et al. October 7, 2 | 2003-10-07 |
| Plasma processing system and method for manufacturing a semiconductor device by using the same Grant 6,551,445 - Yokogawa , et al. April 22, 2 | 2003-04-22 |
| Plasma treatment apparatus and plasma treatment method Grant 6,475,918 - Izawa , et al. November 5, 2 | 2002-11-05 |
| Dry cleaning apparatus App 20020092121 - Momonoi, Yoshinori ; et al. | 2002-07-18 |
| Method for manufacturing semiconductor device App 20020094691 - Yokogawa, Kenetsu ; et al. | 2002-07-18 |
| Dry cleaning method App 20020092541 - Yokogawa, Kenetsu ; et al. | 2002-07-18 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 