Patent | Date |
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System and method for counting fail bit and reading out the same Grant 11,437,116 - Mohr , et al. September 6, 2 | 2022-09-06 |
Charge Pump Supply Optimization And Noise Reduction Method For Logic Systems App 20210210122 - Mohr; Christian N. ;   et al. | 2021-07-08 |
Charge pump supply optimization and noise reduction method for logic systems Grant 10,957,364 - Mohr , et al. March 23, 2 | 2021-03-23 |
Apparatuses And Method For Trimming Input Buffers Based On Identified Mismatches App 20200342922 - Mohr; Christian N. ;   et al. | 2020-10-29 |
Semiconductor Devices Having Through-stack Interconnects For Facilitating Connectivity Testing App 20200303349 - Mohr; Christian N. ;   et al. | 2020-09-24 |
System And Method For Counting Fail Bit And Reading Out The Same App 20200243155 - Mohr; Christian N. ;   et al. | 2020-07-30 |
Apparatuses and method for trimming input buffers based on identified mismatches Grant 10,714,156 - Mohr , et al. | 2020-07-14 |
Semiconductor devices having through-stack interconnects for facilitating connectivity testing Grant 10,692,841 - Mohr , et al. | 2020-06-23 |
System and method for counting fail bit and reading out the same Grant 10,643,734 - Mohr , et al. | 2020-05-05 |
Charge Pump Supply Optimization And Noise Reduction Method For Logic Systems App 20200098398 - Mohr; Christian N. ;   et al. | 2020-03-26 |
Apparatuses And Method For Trimming Input Buffers Based On Identified Mismatches App 20200075067 - Mohr; Christian N. ;   et al. | 2020-03-05 |
Semiconductor Devices Having Through-stack Interconnects For Facilitating Connectivity Testing App 20200006291 - Mohr; Christian N. ;   et al. | 2020-01-02 |
System And Method For Counting Fail Bit And Reading Out The Same App 20200005885 - Mohr; Christian N. ;   et al. | 2020-01-02 |
Test Mode Signal Distribution Schemes For Memory Systems And Associated Methods App 20190348138 - Mohr; Christian N. ;   et al. | 2019-11-14 |
Memory devices and method for error test, recordation and repair Grant 8,499,207 - Mohr , et al. July 30, 2 | 2013-07-30 |
Memory Devices And Method For Error Test, Recordation And Repair App 20120297257 - Mohr; Christian N. ;   et al. | 2012-11-22 |
Method for error test, recordation and repair Grant 8,234,527 - Mohr , et al. July 31, 2 | 2012-07-31 |
Method For Error Test, Recordation And Repair App 20110209011 - Mohr; Christian N. ;   et al. | 2011-08-25 |
Method for error test, recordation and repair Grant 7,941,712 - Mohr , et al. May 10, 2 | 2011-05-10 |
Circuit and method for error test, recordation, and repair Grant 7,509,543 - Mohr , et al. March 24, 2 | 2009-03-24 |
Circuit and method for stable fuse detection Grant 7,482,855 - Mohr , et al. January 27, 2 | 2009-01-27 |
Circuit and method for stable fuse detection App 20080061839 - Mohr; Christian N. ;   et al. | 2008-03-13 |
Circuit and method for stable fuse detection Grant 7,276,955 - Mohr , et al. October 2, 2 | 2007-10-02 |
Method for error test, recordation and repair App 20070168774 - Mohr; Christian N. ;   et al. | 2007-07-19 |
Reduced power redundancy address decoder and comparison circuit Grant 7,145,817 - Mohr , et al. December 5, 2 | 2006-12-05 |
Circuit and method for test and repair App 20060242497 - Cowles; Timothy B. ;   et al. | 2006-10-26 |
Circuit and method for stable fuse detection App 20060232323 - Mohr; Christian N. ;   et al. | 2006-10-19 |
Circuit and method for time-efficient memory repair Grant 6,918,072 - Cowles , et al. July 12, 2 | 2005-07-12 |
Reduced power redundancy address decoder and comparison circuit App 20050099861 - Mohr, Christian N. ;   et al. | 2005-05-12 |
Reduced power redundancy address decoder and comparison circuit Grant 6,868,019 - Mohr , et al. March 15, 2 | 2005-03-15 |
Reduced Power Redundancy Address Decoder And Comparison Circuit App 20050002243 - Mohr, Christian N. ;   et al. | 2005-01-06 |
Circuit and method for error test, recordation, and repair App 20040261049 - Mohr, Christian N. ;   et al. | 2004-12-23 |
Circuit and method for test and repair App 20020133770 - Cowles, Timothy B. ;   et al. | 2002-09-19 |
Circuit and method for test and repair App 20020133769 - Cowles, Timothy B. ;   et al. | 2002-09-19 |