Mohara; Yukihisa
Patent Applications and Registrations
Patent applications and USPTO patent grants for Mohara; Yukihisa.The latest application filed is for "inspection apparatus and inspection method".
- Mohara; Yukihisa - Tokyo JP
- Mohara; Yukihisa - Hitachinaka JP
- Mohara; Yukihisa - Kamisato JP
| Patent | Date |
|---|---|
| Inspection apparatus and inspection method Grant 10,458,924 - Kanai , et al. Oc | 2019-10-29 |
| Inspection Apparatus And Inspection Method App 20190178813 - KANAI; Hisaaki ; et al. | 2019-06-13 |
| Optical type inspection apparatus, inspection system and the wafer for coordinates management Grant 9,097,686 - Bamba , et al. August 4, 2 | 2015-08-04 |
| Optical Type Inspection Apparatus, Inspection System And The Wafer For Coordinates Management App 20140192352 - Bamba; Yoshio ; et al. | 2014-07-10 |
| Inspection apparatus and inspection method Grant 8,525,984 - Yamashita , et al. September 3, 2 | 2013-09-03 |
| Inspection Apparatus App 20130194579 - Mohara; Yukihisa ; et al. | 2013-08-01 |
| Method of apparatus for detecting particles on a specimen Grant 8,289,507 - Hamamatsu , et al. October 16, 2 | 2012-10-16 |
| Inspection Apparatus And Inspection Method App 20120224173 - Yamashita; Hiroyuki ; et al. | 2012-09-06 |
| Inspection Apparatus And Inspection Method App 20110285989 - YAMASHITA; Hiroyuki ; et al. | 2011-11-24 |
| Method Of Apparatus For Detecting Particles On A Specimen App 20110228258 - HAMAMATSU; Akira ; et al. | 2011-09-22 |
| Inspection apparatus and inspection method Grant 7,999,932 - Yamashita , et al. August 16, 2 | 2011-08-16 |
| Method of apparatus for detecting particles on a specimen Grant 7,952,700 - Hamamatsu , et al. May 31, 2 | 2011-05-31 |
| Method Of Apparatus For Detecting Particles On A Specimen App 20110032515 - HAMAMATSU; Akira ; et al. | 2011-02-10 |
| Method of apparatus for detecting particles on a specimen Grant 7,817,261 - Hamamatsu , et al. October 19, 2 | 2010-10-19 |
| Inspection Apparatus And Inspection Method App 20100208251 - YAMASHITA; Hiroyuki ; et al. | 2010-08-19 |
| Inspection apparatus and inspection method Grant 7,733,473 - Yamashita , et al. June 8, 2 | 2010-06-08 |
| Inspection Apparatus And Inspection Method App 20080239319 - YAMASHITA; Hiroyuki ; et al. | 2008-10-02 |
| Method Of Apparatus For Detecting Particles On A Specimen App 20080204724 - Hamamatsu; Akira ; et al. | 2008-08-28 |
| Method of apparatus for detecting particles on a specimen Grant 7,369,223 - Hamamatsu , et al. May 6, 2 | 2008-05-06 |
| Method of apparatus for detecting particles on a specimen App 20050213086 - Hamamatsu, Akira ; et al. | 2005-09-29 |
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