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Patent applications and USPTO patent grants for Mohammadi-Gheidari; Ali.The latest application filed is for "magnetic field free sample plane for charged particle microscope".
Patent | Date |
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Magnetic field free sample plane for charged particle microscope Grant 11,450,505 - Henstra , et al. September 20, 2 | 2022-09-20 |
Magnetic Field Free Sample Plane For Charged Particle Microscope App 20220199353 - Henstra; Alexander ;   et al. | 2022-06-23 |
Dual Beam Bifocal Charged Particle Microscope App 20210305007 - Henstra; Alexander ;   et al. | 2021-09-30 |
Multi-electron-beam imaging apparatus with improved performance Grant 10,971,326 - Mohammadi-Gheidari , et al. April 6, 2 | 2021-04-06 |
Multi-beam Scanning Electron Microscope App 20200373115 - Mohammadi-Gheidari; Ali ;   et al. | 2020-11-26 |
Multi-beam charged particle imaging apparatus Grant 10,790,113 - Sed'a , et al. September 29, 2 | 2020-09-29 |
Charged Particle Beam Device For Inspection Of A Specimen With A Plurality Of Charged Particle Beamlets App 20200273667 - Mohammadi-Gheidari; Ali ;   et al. | 2020-08-27 |
Multi-beam scanning transmission charged particle microscope Grant 10,607,811 - Mohammadi-Gheidari , et al. | 2020-03-31 |
Multi-electron-beam Imaging Apparatus With Improved Performance App 20200090899 - Mohammadi-Gheidari; Ali ;   et al. | 2020-03-19 |
Multi-beam Charged Particle Imaging Apparatus App 20190393013 - Sed'a; Bohuslav ;   et al. | 2019-12-26 |
Emission noise correction of a charged particle source Grant 10,453,647 - Mohammadi-Gheidari , et al. Oc | 2019-10-22 |
Gun lens design in a charged particle microscope Grant 10,410,827 - Mohammadi-Gheidari , et al. Sept | 2019-09-10 |
Gun Lens Design In A Charged Particle Microscope App 20180323036 - Mohammadi-Gheidari; Ali ;   et al. | 2018-11-08 |
Apparatus and method for inspecting a surface of a sample Grant 9,697,985 - Kruit , et al. July 4, 2 | 2017-07-04 |
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