MOCHIZUKI; Yuzuru

Patent Applications and Registrations

Patent applications and USPTO patent grants for MOCHIZUKI; Yuzuru.The latest application filed is for "charged particle beam system".

Company Profile

2.6.6

MOCHIZUKI; Yuzuru - Minato-ku Tokyo
Mochizuki; Yuzuru - Tokyo JP
Mochizuki; Yuzuru - Hitachinaka N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged Particle Beam System App 20220223372 - AKIMOTO; Naoki ; et al.	2022-07-14
Charged particle beam device and capturing condition adjusting method in charged particle beam device Grant 10,770,266 - Nakano , et al. Sep	2020-09-08
Charged particle beam apparatus and method for adjusting imaging conditions for the same Grant 10,566,172 - Nakano , et al. Feb	2020-02-18
Charged Particle Beam Device and Capturing Condition Adjusting Method in Charged Particle Beam Device App 20200035449 - NAKANO; Tomohito ; et al.	2020-01-30
Charged Particle Beam Apparatus and Method for Adjusting Imaging Conditions for the Same App 20190172676 - NAKANO; Tomohito ; et al.	2019-06-06
Pattern measuring apparatus and computer program Grant 9,000,365 - Mochizuki , et al. April 7, 2	2015-04-07
Electron microscope and image capturing method using electron beam Grant 8,907,279 - Tsuno , et al. December 9, 2	2014-12-09
Electron Microscope And Image Capturing Method Using Electron Beam App 20140097342 - Tsuno; Natsuki ; et al.	2014-04-10
Pattern Measuring Apparatus And Computer Program App 20120037801 - Mochizuki; Yuzuru ; et al.	2012-02-16

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