loadpatents
name:-0.021839141845703
name:-0.018410921096802
name:-0.00051093101501465
Mo; Wang-Pen Patent Filings

Mo; Wang-Pen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mo; Wang-Pen.The latest application filed is for "lithography process on high topology features".

Company Profile
0.22.24
  • Mo; Wang-Pen - Pingtung TW
  • Mo; Wang-Pen - Pingtung City TW
  • Mo; Wang-Pen - Pingtung County TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method of forming a photoresist layer
Grant 9,875,892 - Chang , et al. January 23, 2
2018-01-23
Lithography process on high topology features
Grant 9,791,775 - Chang , et al. October 17, 2
2017-10-17
Film portion at wafer edge
Grant 9,651,869 - Chang , et al. May 16, 2
2017-05-16
Lithography Process on High Topology Features
App 20160195807 - Chang; Chun-Wei ;   et al.
2016-07-07
Film portion at wafer edge
Grant 9,372,406 - Chang , et al. June 21, 2
2016-06-21
Thickening phase for spin coating process
Grant 9,360,755 - Chang , et al. June 7, 2
2016-06-07
Test structure placement on a semiconductor wafer
Grant 9,349,662 - Wu , et al. May 24, 2
2016-05-24
Lithography process on high topology features
Grant 9,285,677 - Chang , et al. March 15, 2
2016-03-15
Method of fabricating a metal grid for semiconductor device
Grant 9,153,620 - Wang , et al. October 6, 2
2015-10-06
Method Of Fabricating A Metal Grid For Semiconductor Device
App 20150249109 - Wang; Chih-Chien ;   et al.
2015-09-03
Method Of Forming A Photoresist Layer
App 20150243500 - Chang; Chun-Wei ;   et al.
2015-08-27
Film Portion At Wafer Edge
App 20150212420 - CHANG; Chun-Wei ;   et al.
2015-07-30
Method of forming a photoresist layer
Grant 9,028,915 - Chang , et al. May 12, 2
2015-05-12
Metal grid in backside illumination image sensor chips and methods for forming the same
Grant 8,940,574 - Wang , et al. January 27, 2
2015-01-27
Method of semiconductor integrated circuit fabrication
Grant 8,883,403 - Chen , et al. November 11, 2
2014-11-11
Lithography Process on High Topology Features
App 20140272715 - Chang; Chun-Wei ;   et al.
2014-09-18
Thickening Phase For Spin Coating Process
App 20140272704 - Chang; Chun-Wei ;   et al.
2014-09-18
Manufacturing techniques for workpieces with varying topographies
Grant 8,771,534 - Chen , et al. July 8, 2
2014-07-08
Method to form a CMOS image sensor
Grant 8,759,225 - Wang , et al. June 24, 2
2014-06-24
Test Structure Placement on a Semiconductor Wafer
App 20140151699 - Wu; Chuan-Ling ;   et al.
2014-06-05
Semiconductor devices and manufacturing methods thereof
Grant 8,692,296 - Chen , et al. April 8, 2
2014-04-08
Method Of Semiconductor Integrated Circuit Fabrication
App 20140080067 - Chen; Chun-Chang ;   et al.
2014-03-20
Method to Form a CMOS Image Sensor
App 20140061738 - Wang; Chung Chien ;   et al.
2014-03-06
Method of Forming a Photoresist Layer
App 20140065843 - Chang; Chun-Wei ;   et al.
2014-03-06
Manufacturing techniques to limit damage on workpiece with varying topographies
Grant 8,623,229 - Chen , et al. January 7, 2
2014-01-07
Method Of Removing Residue During Semiconductor Device Fabrication
App 20130302985 - Wu; Chun-Chang ;   et al.
2013-11-14
Metal Grid in Backside Illumination Image Sensor Chips and Methods for Forming the Same
App 20130270667 - Wang; Chih-Chien ;   et al.
2013-10-17
Film Portion At Wafer Edge
App 20130273740 - CHANG; Chun-Wei ;   et al.
2013-10-17
Semiconductor Devices and Manufacturing Methods Thereof
App 20130207163 - Chen; Chun-Chang ;   et al.
2013-08-15
Manufacturing Techniques for Workpieces with Varying Topographies
App 20130181320 - Chen; Chun-Chang ;   et al.
2013-07-18
Manufacturing Techniques To Limit Damage On Workpiece With Varying Topographies
App 20130137266 - Chen; Chun-Chang ;   et al.
2013-05-30

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