MJC PROBE INC.
Patent Applications and Registrations
Patent applications and USPTO patent grants for MJC PROBE INC..The latest application filed is for "apparatus for probing die electricity and method for forming the same".
- MJC PROBE INC. - Hsinchu Hsiang TW
- MJC Probe Incorporated - Hsinchu Hsiang TW
- MJC Probe Incorporation - Hsinchu Hsiang TW
- MJC PROBE INCORPORATION - Chu-Pei City TW
- MJC Probe Incorporation - Chu-Pei Hsinchu Hsiang TW
- MJC PROBE INC. - No. 155, Chung-Ho St., Hsinchu Hsiang Chu-Pei City TW
- MJC Probe Incorporation - TW TW
- MJC Probe Inc. - Chu-PEI City TW
- MJC Probe Inc. - Hsin-Chu TW
- MJC Probe Inc. -
| Patent | Date |
|---|---|
| Apparatus For Probing Die Electricity And Method For Forming The Same App 20130147507 - LEE; CHUNG-TSE ; et al. | 2013-06-13 |
| Pick-and-place Apparatus App 20110076124 - Yang; Tien-Te | 2011-03-31 |
| Probing device Grant 7,782,070 - Ku , et al. August 24, 2 | 2010-08-24 |
| Waterproof and breathable insole Grant 7,543,398 - Hsaio , et al. June 9, 2 | 2009-06-09 |
| Probe card Grant 7,477,061 - Fan January 13, 2 | 2009-01-13 |
| Probing Device App 20090009198 - Ku; Wei-Cheng ; et al. | 2009-01-08 |
| Electrical Contact Device And Its Manufacturing Process App 20080278185 - CHEN; Chih-Chung | 2008-11-13 |
| Elastic micro probe and method of making same Grant 7,446,548 - Chen November 4, 2 | 2008-11-04 |
| Cantilever-type probe card for high frequency application App 20080191726 - Ku; Wei-Cheng ; et al. | 2008-08-14 |
| Vertical probe device Grant 7,400,156 - Wu , et al. July 15, 2 | 2008-07-15 |
| Vertical type high frequency probe card Grant 7,368,928 - Lin , et al. May 6, 2 | 2008-05-06 |
| Vertical Type High Frequency Probe Card App 20080054918 - Lin; Hsin-Hung ; et al. | 2008-03-06 |
| Vertical probe device App 20080054919 - Wu; Shih-Chang ; et al. | 2008-03-06 |
| High-frequency probe card and transmission line for high-frequency probe card App 20080007278 - Ku; Wei-Cheng ; et al. | 2008-01-10 |
| Multi-Directional Gripping Apparatus App 20070217897 - Yang; Tien-Te ; et al. | 2007-09-20 |
| Micro contact device comprising the micro contact element and the base member Grant 7,267,557 - Chen September 11, 2 | 2007-09-11 |
| High frequency cantilever-type probe card App 20070200584 - Ku; Wei-Cheng | 2007-08-30 |
| Probe card App 20070176614 - Fan; Horng-Kuang | 2007-08-02 |
| Method for making guide panel for vertical probe card in batch App 20070114204 - Cheng; Chih-Yung ; et al. | 2007-05-24 |
| Reinforced guide panel for vertical probe card App 20070115012 - Cheng; Chih-Yung ; et al. | 2007-05-24 |
| Probes of probe card and the method of making the same App 20070103177 - Chen; Chih-Chung | 2007-05-10 |
| Stepped PCB for probe card, probe card having the same and method for clamping the probe card App 20070090847 - Lu; Fu-Chin ; et al. | 2007-04-26 |
| Electrical contact device of probe card App 20070045535 - Chen; Chih-Chung | 2007-03-01 |
| Integrated circuit probe card Grant 7,154,284 - Fan , et al. December 26, 2 | 2006-12-26 |
| Probe device for electrical testing an integrated circuit device and probe card using the same Grant 7,053,636 - Sudin May 30, 2 | 2006-05-30 |
| Multi-function probe card Grant 6,984,998 - Sun , et al. January 10, 2 | 2006-01-10 |
| Multi-function probe card App 20050184741 - Sun, Horng-Chuan ; et al. | 2005-08-25 |
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