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name:-0.014477968215942
name:-0.011744976043701
name:-0.0065901279449463
Mizuhara; Yuzuru Patent Filings

Mizuhara; Yuzuru

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mizuhara; Yuzuru.The latest application filed is for "charged particle beam apparatus and control method".

Company Profile
6.10.12
  • Mizuhara; Yuzuru - Tokyo JP
  • Mizuhara; Yuzuru - Naka JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Charged particle beam device
Grant 11,456,150 - Bizen , et al. September 27, 2
2022-09-27
Charged Particle Beam Apparatus And Control Method
App 20220115203 - BIZEN; Kaori ;   et al.
2022-04-14
Charged Particle Beam Device And Power Supply Device
App 20220068595 - Li; Wen ;   et al.
2022-03-03
Charged Particle Beam Device
App 20210313140 - BIZEN; Kaori ;   et al.
2021-10-07
Charged-particle beam device
Grant 10,964,508 - Mizuhara , et al. March 30, 2
2021-03-30
Charged-Particle Beam Device
App 20200258713 - A1
2020-08-13
Charged particle beam device
Grant 10,541,103 - Mizuhara , et al. Ja
2020-01-21
Charged particle beam device
Grant 10,446,359 - Yokosuka , et al. Oc
2019-10-15
Charged particle beam inclination correction method and charged particle beam device
Grant 10,229,811 - Mizuhara , et al.
2019-03-12
Charged particle beam device
Grant 10,020,160 - Kuroda , et al. July 10, 2
2018-07-10
Charged Particle Beam Device
App 20180012725 - YOKOSUKA; Toshiyuki ;   et al.
2018-01-11
Charged Particle Beam Device
App 20170345613 - MIZUHARA; Yuzuru ;   et al.
2017-11-30
Charged Particle Beam Device
App 20170221672 - KURODA; Koichi ;   et al.
2017-08-03
Charged particle beam device
Grant 9,627,171 - Makino , et al. April 18, 2
2017-04-18
Charged particle beam apparatus
Grant 9,502,212 - Mizuhara , et al. November 22, 2
2016-11-22
Scanning electron microscope
Grant 9,472,376 - Yokosuka , et al. October 18, 2
2016-10-18
Charged Particle Beam Inclination Correction Method and Charged Particle Beam Device
App 20160217969 - MIZUHARA; Yuzuru ;   et al.
2016-07-28
Charged Particle Beam Device
App 20150357153 - MAKINO; Hiroshi ;   et al.
2015-12-10
Charged Particle Beam Apparatus
App 20150348748 - MIZUHARA; Yuzuru ;   et al.
2015-12-03
Scanning Electron Microscope
App 20150008322 - Yokosuka; Toshiyuki ;   et al.
2015-01-08
Charged particle beam apparatus
Grant 8,648,300 - Isawa , et al. February 11, 2
2014-02-11
Charged Particle Beam Apparatus
App 20140014836 - ISAWA; Miki ;   et al.
2014-01-16

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