loadpatents
Patent applications and USPTO patent grants for Mizuhara; Yuzuru.The latest application filed is for "charged particle beam apparatus and control method".
Patent | Date |
---|---|
Charged particle beam device Grant 11,456,150 - Bizen , et al. September 27, 2 | 2022-09-27 |
Charged Particle Beam Apparatus And Control Method App 20220115203 - BIZEN; Kaori ;   et al. | 2022-04-14 |
Charged Particle Beam Device And Power Supply Device App 20220068595 - Li; Wen ;   et al. | 2022-03-03 |
Charged Particle Beam Device App 20210313140 - BIZEN; Kaori ;   et al. | 2021-10-07 |
Charged-particle beam device Grant 10,964,508 - Mizuhara , et al. March 30, 2 | 2021-03-30 |
Charged-Particle Beam Device App 20200258713 - A1 | 2020-08-13 |
Charged particle beam device Grant 10,541,103 - Mizuhara , et al. Ja | 2020-01-21 |
Charged particle beam device Grant 10,446,359 - Yokosuka , et al. Oc | 2019-10-15 |
Charged particle beam inclination correction method and charged particle beam device Grant 10,229,811 - Mizuhara , et al. | 2019-03-12 |
Charged particle beam device Grant 10,020,160 - Kuroda , et al. July 10, 2 | 2018-07-10 |
Charged Particle Beam Device App 20180012725 - YOKOSUKA; Toshiyuki ;   et al. | 2018-01-11 |
Charged Particle Beam Device App 20170345613 - MIZUHARA; Yuzuru ;   et al. | 2017-11-30 |
Charged Particle Beam Device App 20170221672 - KURODA; Koichi ;   et al. | 2017-08-03 |
Charged particle beam device Grant 9,627,171 - Makino , et al. April 18, 2 | 2017-04-18 |
Charged particle beam apparatus Grant 9,502,212 - Mizuhara , et al. November 22, 2 | 2016-11-22 |
Scanning electron microscope Grant 9,472,376 - Yokosuka , et al. October 18, 2 | 2016-10-18 |
Charged Particle Beam Inclination Correction Method and Charged Particle Beam Device App 20160217969 - MIZUHARA; Yuzuru ;   et al. | 2016-07-28 |
Charged Particle Beam Device App 20150357153 - MAKINO; Hiroshi ;   et al. | 2015-12-10 |
Charged Particle Beam Apparatus App 20150348748 - MIZUHARA; Yuzuru ;   et al. | 2015-12-03 |
Scanning Electron Microscope App 20150008322 - Yokosuka; Toshiyuki ;   et al. | 2015-01-08 |
Charged particle beam apparatus Grant 8,648,300 - Isawa , et al. February 11, 2 | 2014-02-11 |
Charged Particle Beam Apparatus App 20140014836 - ISAWA; Miki ;   et al. | 2014-01-16 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.