Miyase; Kohei

Patent Applications and Registrations

Patent applications and USPTO patent grants for Miyase; Kohei.The latest application filed is for "fault detection system, generation circuit, and program".

Company Profile

0.13.11

Miyase; Kohei - Fukuoka JP
Miyase; Kohei - Iizuka N/A JP
Miyase; Kohei - Kitakyushu JP
Miyase; Kohei - Kitakyushu-shi JP
Miyase; Kohei - Fukuoka-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Fault detection system, generation circuit, and program Grant 9,383,408 - Sato , et al. July 5, 2	2016-07-05
Fault Detection System, Generation Circuit, And Program App 20150247898 - Sato; Yasuo ; et al.	2015-09-03
Don't-care-bit identification method and don't-care-bit identification program Grant 8,589,751 - Miyase , et al. November 19, 2	2013-11-19
Target logic value determination method for unspecified bit in test vector for combinational circuit and non-transitory computer-readable medium Grant 8,453,023 - Miyase , et al. May 28, 2	2013-05-28
Generating device, generating method, and program Grant 8,429,472 - Miyase , et al. April 23, 2	2013-04-23
Conversion device, conversion method, program, and recording medium Grant 8,037,387 - Kajihara , et al. October 11, 2	2011-10-11
Generation Device, Classification Method, Generation Method, And Program App 20110209024 - Wu; Meng-Fan ; et al.	2011-08-25
Test pattern generation method for avoiding false testing in two-pattern testing for semiconductor integrated circuit Grant 8,001,437 - Wen , et al. August 16, 2	2011-08-16
Generating device, generating method, program and recording medium Grant 7,979,765 - Wen , et al. July 12, 2	2011-07-12
Conversion device, conversion method, program, and recording medium Grant 7,971,118 - Wen , et al. June 28, 2	2011-06-28
Generating Device, Generating Method, And Program App 20110140734 - Miyase; Kohei ; et al.	2011-06-16
Generating device, generating method, program and recording medium Grant 7,962,822 - Wen , et al. June 14, 2	2011-06-14
Diagnostic device, diagnostic method, program, and recording medium Grant 7,913,144 - Wen , et al. March 22, 2	2011-03-22
Don't-care-bit Identification Method And Don't-care-bit Identification Program App 20100218063 - Miyase; Kohei ; et al.	2010-08-26
Logic Value Determination Method And Logic Value Determination Program App 20100205491 - Miyase; Kohei ; et al.	2010-08-12
Test Pattern Generation Method For Avoiding False Testing In Two-pattern Testing For Semiconductor Integrated Circuit App 20100095179 - Wen; Xiaoqing ; et al.	2010-04-15
Diagnostic Device, Diagnostic Method, Program, And Recording Medium App 20100064191 - Wen; Xiaoqing ; et al.	2010-03-11
Generating Device, Generating Method, Program And Recording Medium App 20090319842 - Wen; Xiaoqing ; et al.	2009-12-24
Conversion Device, Conversion Method, Program, And Recording Medium App 20090113261 - Kajihara; Seiji ; et al.	2009-04-30
Generating Device, Generating Method, Program And Recording Medium App 20090019327 - Wen; Xiaoqing ; et al.	2009-01-15
Conversion Device, Conversion Method, Program, And Recording Medium App 20080235543 - Wen; Xiaoqing ; et al.	2008-09-25

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