| Patent | Date |
|---|
Semiconductor Device
App 20210233804 - MIYANO; Yumiko | 2021-07-29 |
Semiconductor device
Grant 11,004,731 - Miyano May 11, 2 | 2021-05-11 |
Semiconductor device
Grant 10,770,471 - Shimizu , et al. Sep | 2020-09-08 |
Semiconductor Device
App 20200051989 - SHIMIZU; Kojiro ; et al. | 2020-02-13 |
Semiconductor Device
App 20190019723 - MIYANO; Yumiko | 2019-01-17 |
Semiconductor device
Grant 10,115,627 - Miyano October 30, 2 | 2018-10-30 |
Semiconductor Device
App 20180061701 - MIYANO; Yumiko | 2018-03-01 |
Nonvolatile semiconductor memory device and method for manufacturing the same
Grant 9,831,270 - Sudo , et al. November 28, 2 | 2017-11-28 |
Nonvolatile Semiconductor Memory Device And Method For Manufacturing The Same
App 20170271366 - SUDO; Gaku ; et al. | 2017-09-21 |
Storage Medium Storing Simulation Program, Simulation Device, and Simulation Method
App 20160063138 - MIYANO; Yumiko | 2016-03-03 |
Alignment of semiconductor wafer patterns by corresponding edge groups
Grant 8,126,257 - Miyano , et al. February 28, 2 | 2012-02-28 |
Pattern shape evaluation apparatus, pattern shape evaluation method, method of manufacturing semiconductor device, and program
Grant 7,787,687 - Miyano , et al. August 31, 2 | 2010-08-31 |
Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded
Grant 7,418,363 - Ikeda , et al. August 26, 2 | 2008-08-26 |
Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system
Grant 7,321,680 - Ikeda , et al. January 22, 2 | 2008-01-22 |
Pattern shape evaluation apparatus, pattern shape evaluation method, semiconductor device manufacturing method, and program
App 20070280541 - Miyano; Yumiko ; et al. | 2007-12-06 |
Pattern shape evaluation apparatus, pattern shape evaluation method, method of manufacturing semiconductor device, and program
App 20070098249 - Miyano; Yumiko ; et al. | 2007-05-03 |
Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded
App 20050278138 - Ikeda, Takahiro ; et al. | 2005-12-15 |
Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded
Grant 6,963,819 - Ikeda , et al. November 8, 2 | 2005-11-08 |
Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system
App 20040181361 - Ikeda, Takahiro ; et al. | 2004-09-16 |
Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system
Grant 6,772,089 - Ikeda , et al. August 3, 2 | 2004-08-03 |
Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded
App 20040131246 - Ikeda, Takahiro ; et al. | 2004-07-08 |
Method for measuring fine pattern, apparatus for measuring fine pattern, and record medium that can store therein program to measure fine pattern and can be read by using computer
Grant 6,647,147 - Miyano November 11, 2 | 2003-11-11 |
Graphic contour extracting method, pattern inspecting method, program and pattern inspection system
App 20030074156 - Ikeda, Takahiro ; et al. | 2003-04-17 |
Method for measuring size of fine pattern
Grant 6,363,167 - Miyano , et al. March 26, 2 | 2002-03-26 |
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