Miyanaga; Isao

Patent Applications and Registrations

Patent applications and USPTO patent grants for Miyanaga; Isao.The latest application filed is for "semiconductor device having silicide transistors and non-silicide transistors formed on the same substrate and method for fabricating the same".

Company Profile

0.20.11

Miyanaga; Isao - Toyama JP
Miyanaga; Isao - Nara JP
Miyanaga; Isao - Osaka JP
Miyanaga, Isao - Nara-shi JP
Miyanaga; Isao - Moriguchi JP
Miyanaga; Isao - Kawachinagano JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor Device Having Silicide Transistors And Non-silicide Transistors Formed On The Same Substrate And Method For Fabricating The Same App 20100173465 - KAMEI; Masayuki ; et al.	2010-07-08
Semiconductor device having silicide transistors and non-silicide transistors formed on the same substrate and method for fabricating the same Grant 7,709,911 - Kamei , et al. May 4, 2	2010-05-04
Semiconductor device and method for fabricating the same Grant 7,495,295 - Nakanishi , et al. February 24, 2	2009-02-24
Semiconductor device and method for fabricating the same App 20070131984 - Kamei; Masayuki ; et al.	2007-06-14
Semiconductor device and method of manufacturing the same Grant 7,126,174 - Segawa , et al. October 24, 2	2006-10-24
Semiconductor device and method for fabricating the same App 20060170065 - Nakanishi; Kentaro ; et al.	2006-08-03
Semiconductor device and manufacturing method thereof Grant 7,057,236 - Yamada , et al. June 6, 2	2006-06-06
Method of forming insulating film and method of fabricating semiconductor device including plasma bias for forming a second insulating film Grant 7,033,874 - Itonaga , et al. April 25, 2	2006-04-25
Semiconductor device Grant 6,974,987 - Ogawa , et al. December 13, 2	2005-12-13
Semiconductor device and method of manufacturing the same Grant 6,967,409 - Segawa , et al. November 22, 2	2005-11-22
Semiconductor device and method of manufacturing the same App 20050156220 - Segawa, Mizuki ; et al.	2005-07-21
Semiconductor device and manufacturing method thereof Grant 6,890,824 - Yamada , et al. May 10, 2	2005-05-10
Semiconductor device and method of manufacturing the same App 20050093089 - Segawa, Mizuki ; et al.	2005-05-05
Semiconductor device and manufacturing method thereof App 20040229463 - Yamada, Takayuki ; et al.	2004-11-18
Method of forming insulating film and method of fabricating semiconductor device App 20040224450 - Itonaga, Kazuichiro ; et al.	2004-11-11
Method of forming insulating film and method of fabricating semiconductor device Grant 6,800,512 - Itonaga , et al. October 5, 2	2004-10-05
Semiconductor device and its manufacturing method App 20040150025 - Ogawa, Hisashi ; et al.	2004-08-05
Semiconductor device and method of manufacturing the same Grant 6,709,950 - Segawa , et al. March 23, 2	2004-03-23
Semiconductor device and method of manufacturing the same App 20030205820 - Segawa, Mizuki ; et al.	2003-11-06
Semicondutor device and manufacturing method thereof App 20030038320 - Yamada, Takayuki ; et al.	2003-02-27
Semiconductor device and method of manufacturing the same App 20010054741 - Segawa, Mizuki ; et al.	2001-12-27
Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method Grant 6,323,663 - Nakata , et al. November 27, 2	2001-11-27
Semiconductor device which reduces the minimum distance requirements between active areas Grant 6,281,562 - Segawa , et al. August 28, 2	2001-08-28
Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method Grant 6,005,401 - Nakata , et al. December 21, 1	1999-12-21
Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method Grant 5,945,834 - Nakata , et al. August 31, 1	1999-08-31
Probe sheet and method of manufacturing the same Grant 5,843,844 - Miyanaga December 1, 1	1998-12-01
Method of fabricating a semiconductor device Grant 5,693,557 - Hirao , et al. December 2, 1	1997-12-02
Method of fabricating a semiconductor device Grant 5,661,068 - Hirao , et al. August 26, 1	1997-08-26
Semiconductor device for protecting an internal circuit from electrostatic damage Grant 5,514,893 - Miyanaga , et al. May 7, 1	1996-05-07
Method of fabricating capacitor or contact for semiconductor device by forming uneven oxide film and reacting silicon with metal containing gas Grant 5,474,949 - Hirao , et al. December 12, 1	1995-12-12
MOS transistor for protection against electrostatic discharge Grant 5,451,799 - Kurimoto , et al. September 19, 1	1995-09-19

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