Miyakawa; Kiyoharu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Miyakawa; Kiyoharu.The latest application filed is for "apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information on wafer surface".
- Miyakawa; Kiyoharu - Kiyotake JP
- Miyakawa, Kiyoharu - Miyazaki JP
| Patent | Date |
|---|---|
| Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information on wafer surface Grant 7,383,156 - Matsusita , et al. June 3, 2 | 2008-06-03 |
| Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information on wafer surface App 20040036863 - Matsusita, Kouzou ; et al. | 2004-02-26 |
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