Miyagi; Yuji
Patent Applications and Registrations
Patent applications and USPTO patent grants for Miyagi; Yuji.The latest application filed is for "chip stack device testing method, chip stack device rearranging unit, and chip stack device testing apparatus".
- Miyagi; Yuji - Tokyo N/A JP
- Miyagi; Yuji - Aomori JP
- Miyagi; Yuji - Kuroishi JP
- Miyagi; Yuji - Kuroishi-shi JP
| Patent | Date |
|---|---|
| Chip stack device testing method, chip stack device rearranging unit, and chip stack device testing apparatus Grant 9,097,761 - Yasuta , et al. August 4, 2 | 2015-08-04 |
| Chip Stack Device Testing Method, Chip Stack Device Rearranging Unit, And Chip Stack Device Testing Apparatus App 20120126844 - YASUTA; Katsuo ; et al. | 2012-05-24 |
| Probe and electrical connecting apparatus using it Grant 7,924,038 - Kuniyoshi , et al. April 12, 2 | 2011-04-12 |
| Probe And Electrical Connecting Apparatus Using It App 20100219854 - Kuniyoshi; Shinji ; et al. | 2010-09-02 |
| Probe assembly, method of producing it and electrical connecting apparatus Grant 7,667,472 - Miura , et al. February 23, 2 | 2010-02-23 |
| Probe for electrical test comprising a positioning mark and probe assembly Grant 7,602,200 - Miyagi , et al. October 13, 2 | 2009-10-13 |
| Probe board mounting apparatus Grant 7,586,316 - Kuniyoshi , et al. September 8, 2 | 2009-09-08 |
| Electrical connecting apparatus Grant 7,525,329 - Miyagi , et al. April 28, 2 | 2009-04-28 |
| Probe Assembly, Method Of Producing It And Electrical Connecting Apparatus App 20090058440 - Miura; Kiyotoshi ; et al. | 2009-03-05 |
| Probe for Electrical Test and Probe Assembly App 20090009201 - Miyagi; Yuji ; et al. | 2009-01-08 |
| Electrical Connecting Apparatus App 20080315905 - Kuniyoshi; Shinji ; et al. | 2008-12-25 |
| Electrical connecting apparatus Grant 7,468,610 - Miyagi , et al. December 23, 2 | 2008-12-23 |
| Cleaning Apparatus For A Probe App 20080280542 - Miyagi; Yuji ; et al. | 2008-11-13 |
| Probe for testing an electrical device Grant 7,449,906 - Miura , et al. November 11, 2 | 2008-11-11 |
| Electrical Connecting Apparatus App 20080197869 - MIYAGI; Yuji ; et al. | 2008-08-21 |
| Electrical Connecting Apparatus App 20080122466 - MIYAGI; Yuji ; et al. | 2008-05-29 |
| Electrical Connecting Apparatus App 20080122467 - MIYAGI; Yuji ; et al. | 2008-05-29 |
| Probe For Electric Test App 20070216433 - Miura; Kiyotoshi ; et al. | 2007-09-20 |
| Wafer inspection device and wafer inspection method Grant 6,498,504 - Miyagi December 24, 2 | 2002-12-24 |
| Wafer inspection device and wafer inspection method App 20020024355 - Suzuki, Masayoshi ; et al. | 2002-02-28 |
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