Miwa; Takafumi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Miwa; Takafumi.The latest application filed is for "charged particle beam apparatus".

Company Profile

11.16.18

Miwa; Takafumi - Tokyo JP
Miwa; Takafumi - Saitama JA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam apparatus Grant 11,398,367 - Miwa , et al. July 26, 2	2022-07-26
Charged particle beam apparatus Grant 11,398,366 - Miwa , et al. July 26, 2	2022-07-26
Measurement system and method for setting observation conditions of measurement apparatus Grant 11,380,518 - Miwa , et al. July 5, 2	2022-07-05
Charged particle beam apparatus Grant 11,335,535 - Nakamura , et al. May 17, 2	2022-05-17
Charged Particle Beam Apparatus App 20220102108 - Miwa; Takafumi ; et al.	2022-03-31
Charged Particle Beam Apparatus App 20220102109 - Miwa; Takafumi ; et al.	2022-03-31
Charged Particle Beam Apparatus App 20220028650 - Miwa; Takafumi ; et al.	2022-01-27
Measurement System and Method for Setting Observation Conditions of Measurement Apparatus App 20210407763 - MIWA; Takafumi ; et al.	2021-12-30
Particle measuring device and particle measuring method Grant 11,143,606 - Hashizume , et al. October 12, 2	2021-10-12
Charged particle beam apparatus and charged particle beam inspection system Grant 11,043,359 - Nakamura , et al. June 22, 2	2021-06-22
Scanning electron microscope and sample observation method using scanning electron microscope Grant 11,011,348 - Bizen , et al. May 18, 2	2021-05-18
Charged Particle Beam Apparatus App 20210043415 - Nakamura; Yohei ; et al.	2021-02-11
Charged Particle Beam Apparatus App 20210043413 - Miwa; Takafumi ; et al.	2021-02-11
Charged Particle Beam Apparatus And Charged Particle Beam Inspection System App 20210043419 - Nakamura; Yohei ; et al.	2021-02-11
Charged Particle Beam Apparatus App 20210043412 - Miwa; Takafumi ; et al.	2021-02-11
Charged particle beam device Grant 10,872,742 - Miwa , et al. December 22, 2	2020-12-22
Particle Measuring Device And Particle Measuring Method App 20200371050 - Hashizume; Tomihiro ; et al.	2020-11-26
Charged Particle Beam Device App 20200006032 - MIWA; Takafumi ; et al.	2020-01-02
Scanning Electron Microscope And Sample Observation Method Using Scanning Electron Microscope App 20190348255 - BIZEN; Daisuke ; et al.	2019-11-14
Scanning electron microscope Grant 10,134,558 - Sohda , et al. November 20, 2	2018-11-20
Charged particle beam apparatus for measuring surface potential of a sample Grant 9,799,486 - Kanno , et al. October 24, 2	2017-10-24
Scanning Electron Microscope App 20170018394 - SOHDA; Yasunari ; et al.	2017-01-19
Electron beam equipment Grant 9,543,053 - Sohda , et al. January 10, 2	2017-01-10
Charged Particle Beam Apparatus App 20160013010 - KANNO; Seiichiro ; et al.	2016-01-14
Electronic microscope, setting method of observation condition of electronic microscope, and observation method using electronic microscope Grant 9,236,220 - Tsuno , et al. January 12, 2	2016-01-12
Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen Grant 9,202,668 - Miwa , et al. December 1, 2	2015-12-01
Electronic Microscope, Setting Method Of Observation Condition Of Electronic Microscope, And Observation Method Using Electronic Microscope App 20150041644 - Tsuno; Natsuki ; et al.	2015-02-12
Electron Beam Equipment App 20150034836 - Sohda; Yasunari ; et al.	2015-02-05
Electron microscope and image capturing method using electron beam Grant 8,907,279 - Tsuno , et al. December 9, 2	2014-12-09
Observation Specimen For Use In Electron Microscopy, Electron Microscopy, Electron Microscope, And Device For Producing Observation Specimen App 20140264018 - Miwa; Takafumi ; et al.	2014-09-18
Electron Microscope And Image Capturing Method Using Electron Beam App 20140097342 - Tsuno; Natsuki ; et al.	2014-04-10
Desalination process by improved multistage electrodialysis Grant 3,933,610 - Ehara , et al. January 20, 1	1976-01-20

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