Miwa; Shigeru

Patent Applications and Registrations

Patent applications and USPTO patent grants for Miwa; Shigeru.The latest application filed is for "probe replacement method for scanning probe microscope".

Company Profile

0.5.4

Miwa; Shigeru - Tsuchiura JP
Miwa; Shigeru - Ibaraki JP
Miwa, Shigeru - Niihari-Gun JP
Miwa; Shigeru - Ichihara JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Probe manufacturing method, probe, and scanning probe microscope Grant 7,388,199 - Morimoto , et al. June 17, 2	2008-06-17
Scanning type probe microscope and probe moving control method therefor Grant 7,350,404 - Kurenuma , et al. April 1, 2	2008-04-01
Scanning probe microscope and measurement method using the same Grant 7,333,191 - Murayama , et al. February 19, 2	2008-02-19
Probe replacement method for scanning probe microscope App 20070180889 - Murayama; Ken ; et al.	2007-08-09
Probe manufacturing method, probe, and scanning probe microsope App 20060284084 - Morimoto; Takafumi ; et al.	2006-12-21
Scanning type probe microscope and probe moving control method therefor App 20060284083 - Kurenuma; Tooru ; et al.	2006-12-21
Scanning probe microscope and measurement method using the same App 20050012936 - Murayama, Ken ; et al.	2005-01-20
Process for producing oil-containing, microspherical carbonaceous particles Grant 4,522,627 - Gomi , et al. June 11, 1	1985-06-11
Process of thermally cracking heavy hydrocarbon oils Grant 4,487,686 - Gomi , et al. December 11, 1	1984-12-11

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