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name:-0.011729001998901
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Mittl; Steven W. Patent Filings

Mittl; Steven W.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mittl; Steven W..The latest application filed is for "voltage balanced stacked clamp".

Company Profile
1.12.9
  • Mittl; Steven W. - Essex Junction VT
  • Mittl; Steven W. - Essex VT
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Voltage balanced stacked clamp
Grant 10,170,460 - Loiseau , et al. J
2019-01-01
Voltage Balanced Stacked Clamp
App 20180247931 - Loiseau; Alain F. ;   et al.
2018-08-30
Voltage Balanced Stacked Clamp
App 20180247932 - Loiseau; Alain F. ;   et al.
2018-08-30
Voltage Balanced Stacked Clamp
App 20180247930 - Loiseau; Alain F. ;   et al.
2018-08-30
Voltage balanced stacked clamp
Grant 9,978,743 - Loiseau , et al. May 22, 2
2018-05-22
Correction for stress induced leakage current in dielectric reliability evaluations
Grant 9,310,418 - Mittl , et al. April 12, 2
2016-04-12
Monitoring aging of silicon in an integrated circuit device
Grant 9,310,424 - Allen-Ware , et al. April 12, 2
2016-04-12
Correction For Stress Induced Leakage Current In Dielectric Reliability Evaluations
App 20150061724 - Mittl; Steven W. ;   et al.
2015-03-05
Correction for stress induced leakage current in dielectric reliability evaluations
Grant 8,937,487 - Mittl , et al. January 20, 2
2015-01-20
Monitoring Aging of Silicon in an Integrated Circuit Device
App 20140244212 - Allen-Ware; Malcolm S. ;   et al.
2014-08-28
Managing aging of silicon in an integrated circuit device
Grant 8,713,490 - Allen-Ware , et al. April 29, 2
2014-04-29
Measuring bias temperature instability induced ring oscillator frequency degradation
Grant 8,587,383 - Brochu, Jr. , et al. November 19, 2
2013-11-19
Measuring Bias Temperature Instability Induced Ring Oscillator Frequency Degradation
App 20130147562 - Brochu, JR.; David G. ;   et al.
2013-06-13
Correction For Stress Induced Leakage Current In Dielectric Reliability Evaluations
App 20120303303 - Mittl; Steven W. ;   et al.
2012-11-29
Deuterium reservoirs and ingress paths
Grant 6,770,501 - Burnham , et al. August 3, 2
2004-08-03
Deuterium reservoirs and ingress paths
App 20030102529 - Burnham, Jay ;   et al.
2003-06-05
Deuterium reservoirs and ingress paths
Grant 6,521,977 - Burnham , et al. February 18, 2
2003-02-18
Electronic switch for decoupling capacitor
Grant 6,307,250 - Krauter , et al. October 23, 2
2001-10-23

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