Mitsui; Tadashi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mitsui; Tadashi.The latest application filed is for "pattern defect inspection apparatus and pattern defect inspection method".

Company Profile

0.40.30

Mitsui; Tadashi - Kamakura N/A JP
MITSUI; Tadashi - Kamakura-Shi JP
Mitsui; Tadashi - Ibaraki JP
Mitsui; Tadashi - Tsukuba JP
Mitsui; Tadashi - Kanagawa JP
Mitsui; Tadashi - Tsukuba-shi JP
Mitsui; Tadashi - Tokyo JP
Mitsui; Tadashi - Manassas VA
Mitsui; Tadashi - Wappingers Falls NY
Mitsui; Tadashi - Yamanashi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Pattern defect inspection using data based on secondary electron from pattern Grant 9,153,419 - Mitsui October 6, 2	2015-10-06
Pattern inspection method and semiconductor device manufacturing method Grant 8,532,395 - Mitsui September 10, 2	2013-09-10
Pattern evaluation system, pattern evaluation method and semiconductor device manufacturing method Grant 8,355,560 - Mitsui January 15, 2	2013-01-15
Defect inspection apparatus and defect inspection method Grant 8,290,242 - Mitsui October 16, 2	2012-10-16
Pattern shape evaluation method, program, and semiconductor device manufacturing method Grant 8,160,349 - Mitsui April 17, 2	2012-04-17
Image processing apparatus, image processing method, defect detection method, semiconductor device manufacturing method, and program Grant 8,150,177 - Mitsui April 3, 2	2012-04-03
Pattern measurement apparatus and pattern measurement method Grant 8,144,338 - Mitsui March 27, 2	2012-03-27
Pattern evaluation method, computer-readable recording medium, and manufacturing method of semiconductor device Grant 8,144,969 - Mitsui March 27, 2	2012-03-27
Pattern Defect Inspection Apparatus And Pattern Defect Inspection Method App 20120068065 - MITSUI; Tadashi	2012-03-22
Alignment of semiconductor wafer patterns by corresponding edge groups Grant 8,126,257 - Miyano , et al. February 28, 2	2012-02-28
Pattern misalignment measurement method, program, and semiconductor device manufacturing method Grant 8,090,192 - Mitsui January 3, 2	2012-01-03
Pattern evaluation method, pattern matching method and computer readable medium Grant 8,086,041 - Mitsui December 27, 2	2011-12-27
Pattern Inspection Method And Semiconductor Device Manufacturing Method App 20110286658 - MITSUI; Tadashi	2011-11-24
Image processing apparatus, image processing method, defect detection method, semiconductor device manufacturing method, and program App 20110280471 - Mitsui; Tadashi	2011-11-17
Pattern edge detecting method and pattern evaluating method Grant 8,045,807 - Mitsui October 25, 2	2011-10-25
Pattern evaluation method, computer-readable medium, and semiconductor device manufacturing method Grant 8,041,105 - Mitsui October 18, 2	2011-10-18
Pattern matching method, program and semiconductor device manufacturing method Grant 8,036,445 - Onishi , et al. October 11, 2	2011-10-11
Pattern shape evaluation method and pattern shape evaluation apparatus utilizing the same Grant 8,019,149 - Abe , et al. September 13, 2	2011-09-13
Image processing apparatus, image processing method, defect detection method, semiconductor device manufacturing method, and program Grant 8,019,165 - Mitsui September 13, 2	2011-09-13
Pattern Evaluation System, Pattern Evaluation Method And Semiconductor Device Manufacturing Method App 20110164807 - MITSUI; Tadashi	2011-07-07
Method for preparing functional nanomaterials utilizing endothermic reaction Grant 7,879,309 - Mitsui , et al. February 1, 2	2011-02-01
Pattern Edge Detecting Method And Pattern Evaluating Method App 20100303361 - MITSUI; Tadashi	2010-12-02
Pattern shape evaluation apparatus, pattern shape evaluation method, method of manufacturing semiconductor device, and program Grant 7,787,687 - Miyano , et al. August 31, 2	2010-08-31
Method for preparing functional nanomaterials utilizing endothermic reaction Grant 7,771,697 - Mitsui , et al. August 10, 2	2010-08-10
Method For Preparing Functional Nanomaterials Utilizing Endothermic Reaction App 20100183494 - MITSUI; Tadashi ; et al.	2010-07-22
Defect Inspection Apparatus And Defect Inspection Method App 20100177952 - MITSUI; Tadashi	2010-07-15
Methods for manufacturing optical fiber probe and for processing micromaterial Grant 7,754,114 - Mitsui , et al. July 13, 2	2010-07-13
Pattern evaluation method, pattern matching method and computer readable medium App 20100158389 - Mitsui; Tadashi	2010-06-24
Pattern Shape Evaluation Method And Pattern Shape Evaluation Apparatus Utilizing The Same App 20100128966 - ABE; Hideaki ; et al.	2010-05-27
Pattern evaluation method, pattern matching method and computer readable medium Grant 7,702,157 - Mitsui April 20, 2	2010-04-20
Pattern Measurement Apparatus And Pattern Measurement Method App 20100046006 - MITSUI; Tadashi	2010-02-25
Pattern evaluation method, method of manufacturing semiconductor, program and pattern evaluation apparatus Grant 7,668,373 - Mitsui February 23, 2	2010-02-23
Pattern Evaluation Method, Computer-readable Recording Medium, And Manufacturing Method Of Semiconductor Device App 20090202140 - MITSUI; Tadashi	2009-08-13
Measurement system and method and computer program for processing measurement data Grant 7,526,408 - Mitsui April 28, 2	2009-04-28
Pattern shape evaluation method, program, and semiconductor device manufacturing method App 20080138916 - Mitsui; Tadashi	2008-06-12
Methods for manufacturing optical fiber probe and for processing micromaterial App 20080121614 - Mitsui; Tadashi ; et al.	2008-05-29
Method of manufacturing optical fiber probe and for finishing micro material Grant 7,341,681 - Mitsui , et al. March 11, 2	2008-03-11
Pattern evaluation method, computer-readable medium, and semiconductor device manufacturing method App 20080056558 - Mitsui; Tadashi	2008-03-06
Image processing apparatus, image processing method, defect detection method, semiconductor device manufacturing method, and program App 20070280547 - Mitsui; Tadashi	2007-12-06
Pattern shape evaluation apparatus, pattern shape evaluation method, semiconductor device manufacturing method, and program App 20070280541 - Miyano; Yumiko ; et al.	2007-12-06
Pattern misalignment measurement method, program, and semiconductor device manufacturing method App 20070248258 - Mitsui; Tadashi	2007-10-25
Pattern evaluation system, pattern evaluation method and program Grant 7,274,820 - Mitsui September 25, 2	2007-09-25
Pattern shape evaluation apparatus, pattern shape evaluation method, method of manufacturing semiconductor device, and program App 20070098249 - Miyano; Yumiko ; et al.	2007-05-03
Pattern measurement method, manufacturing method of semiconductor device, pattern measurement apparatus, and program Grant 7,151,855 - Mitsui December 19, 2	2006-12-19
Pattern evaluation method, pattern matching method and computer readable medium App 20060262977 - Mitsui; Tadashi	2006-11-23
Pattern measuring system and semiconductor device manufacturing method App 20060261268 - Mitsui; Tadashi	2006-11-23
Pattern matching method, program and semiconductor device manufacturing method App 20060110042 - Onishi; Atsushi ; et al.	2006-05-25
Pattern evaluation method, method of manufacturing semiconductor, program and pattern evaluation apparatus App 20060023933 - Mitsui; Tadashi	2006-02-02
Pattern evaluation method, pattern evaluation system and computer-readable recorded medium Grant 6,985,626 - Mitsui January 10, 2	2006-01-10
Measurement system and method and computer program for processing measurement data App 20050256669 - Mitsui, Tadashi	2005-11-17
Method of manufacturing optical fiber probe and for finishing micro material App 20050115922 - Mitsui, Tadashi ; et al.	2005-06-02
Method for preparing functional nanomaterials utilizing endothermic reaction App 20050002849 - Mitsui, Tadashi ; et al.	2005-01-06
Pattern measuring apparatus, pattern measuring method, and manufacturing method of semiconductor device App 20040247172 - Mitsui, Tadashi	2004-12-09
IC handler and contact cleaning method Grant 6,769,963 - Mitsui , et al. August 3, 2	2004-08-03
Pattern measurement method, manufacturing method of semiconductor device, pattern measurement apparatus, and program App 20040131257 - Mitsui, Tadashi	2004-07-08
Pattern evaluation system, pattern evaluation method and program App 20030059104 - Mitsui, Tadashi	2003-03-27
Pattern evaluation method, pattern evaluation system and computer-readable recorded medium App 20020141647 - Mitsui, Tadashi	2002-10-03
IC handler and contact cleaning method App 20020065026 - Mitsui, Tadashi ; et al.	2002-05-30
Method and apparatus for measuring dimensions of a feature of a specimen Grant 6,278,114 - Mitsui August 21, 2	2001-08-21
Plurality of photolithographic alignment marks with shape, size and spacing based on circuit pattern features Grant 5,702,567 - Mitsui , et al. December 30, 1	1997-12-30
Assembly for measuring a trench depth parameter of a workpiece Grant 5,691,540 - Halle , et al. November 25, 1	1997-11-25
Method for producing tips for atomic force microscopes Grant 5,611,942 - Mitsui , et al. March 18, 1	1997-03-18
Handling apparatus for transferring a semiconductor wafer or LCD Grant 5,049,029 - Mitsui , et al. September 17, 1	1991-09-17
Surface-mounted-type inductance element Grant 4,939,494 - Masuda , et al. July 3, 1	1990-07-03
Inductance element Grant 4,549,158 - Mitsui , et al. October 22, 1	1985-10-22
Ferrite core Grant D280,810 - Mitsui October 1, 1	1985-10-01
Ferrite core Grant 4,424,504 - Mitsui , et al. January 3, 1	1984-01-03

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