Mitomo; Kenji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mitomo; Kenji.The latest application filed is for "inspection method and inspection apparatus".

Company Profile

0.8.6

Mitomo; Kenji - Hitachinaka JP
Mitomo; Kenji - Gunma-ken JP
Mitomo; Kenji - Sakai JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Surface inspecting apparatus and method for calibrating same Grant 8,949,043 - Oka , et al. February 3, 2	2015-02-03
Inspection method and inspection apparatus Grant 8,804,108 - Mitomo , et al. August 12, 2	2014-08-12
Inspection Method And Inspection Apparatus App 20120050729 - Mitomo; Kenji ; et al.	2012-03-01
Surface Inspecting Apparatus And Method For Calibrating Same App 20120046884 - Oka; Kenji ; et al.	2012-02-23
Surface inspection method and surface inspection apparatus Grant 7,864,310 - Okawa , et al. January 4, 2	2011-01-04
Surface Inspection Method And Surface Inspection Apparatus App 20100026996 - Okawa; Takashi ; et al.	2010-02-04
Surface inspection method and surface inspection apparatus Grant 7,616,299 - Okawa , et al. November 10, 2	2009-11-10
Surface inspection method and surface inspection apparatus App 20080007727 - Okawa; Takashi ; et al.	2008-01-10
Apparatus and method for inspecting surface of semiconductor wafer or the like Grant 6,798,504 - Sato , et al. September 28, 2	2004-09-28
Apparatus for detecting foreign particle and defect and the same method Grant 6,731,384 - Ohshima , et al. May 4, 2	2004-05-04
Apparatus for detecting foreign particle and defect and the same method App 20020041374 - Ohshima, Yoshimasa ; et al.	2002-04-11
Apparatus and method for inspecting surface of semiconductor wafer or the like App 20020036771 - Sato, Tatsuya ; et al.	2002-03-28

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