Mineo; Hiroyuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mineo; Hiroyuki.The latest application filed is for "electronic component testing apparatus, sockets, and replacement parts for electronic component testing apparatus".

Company Profile

0.5.6

Mineo; Hiroyuki - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electronic Component Testing Apparatus, Sockets, And Replacement Parts For Electronic Component Testing Apparatus App 20210190855 - Shiota; Natsuki ; et al.	2021-06-24
Test section unit, test head and electronic device testing apparatus Grant 8,314,630 - Murakami , et al. November 20, 2	2012-11-20
Test section unit, test head and electronic device testing apparatus App 20100213959 - Murakami; Toru ; et al.	2010-08-26
Measuring board for electronic device test apparatus Grant 7,688,092 - Mineo , et al. March 30, 2	2010-03-30
Measuring board for electronic device test apparatus App 20090033347 - Mineo; Hiroyuki ; et al.	2009-02-05
Connector housing block, interface member and electronic device testing apparatus Grant 7,458,837 - Mineo December 2, 2	2008-12-02
Measurement board for electronic device test apparatus Grant 7,405,582 - Mineo , et al. July 29, 2	2008-07-29
Semiconductor test apparatus and interface plate Grant 7,339,385 - Takasu , et al. March 4, 2	2008-03-04
Measurement board for electronic device test apparatus App 20070296432 - Mineo; Hiroyuki ; et al.	2007-12-27
Connector housing block, interface member and electronic device testing apparatus App 20070167083 - Mineo; Hiroyuki	2007-07-19
Semiconductor test apparatus and interface plate App 20070001702 - Takasu; Hiromitsu ; et al.	2007-01-04

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