MINEKAWA; Yohei

Patent Applications and Registrations

Patent applications and USPTO patent grants for MINEKAWA; Yohei.The latest application filed is for "charged particle beam device".

Company Profile

7.16.17

MINEKAWA; Yohei - Tokyo JP
Minekawa; Yohei - Fujisawa N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged Particle Beam Device App 20210391140 - MINEKAWA; Yohei ; et al.	2021-12-16
Defect observation device Grant 11,177,111 - Ito , et al. November 16, 2	2021-11-16
Defect observation system and defect observation method for semiconductor wafer Grant 10,971,325 - Harada , et al. April 6, 2	2021-04-06
Wafer Observation Apparatus And Wafer Observation Method App 20200411345 - Kondo; Naoaki ; et al.	2020-12-31
Defect Observation Device App 20200335300 - ITO; Akira ; et al.	2020-10-22
Defect observation device Grant 10,770,260 - Otani , et al. Sep	2020-09-08
Defect observation apparatus Grant 10,593,062 - Otani , et al.	2020-03-17
Defect Observation System And Defect Observation Method For Semiconductor Wafer App 20200083017 - HARADA; Minoru ; et al.	2020-03-12
Defect reviewing method and device Grant 10,436,576 - Minekawa , et al. O	2019-10-08
Defect Observation Device App 20190237296 - OTANI; Yuko ; et al.	2019-08-01
Defect quantification method, defect quantification device, and defect evaluation value display device Grant 10,297,021 - Minekawa , et al.	2019-05-21
Defect classification apparatus and defect classification method Grant 10,203,851 - Minekawa , et al. Feb	2019-02-12
Defect image classification apparatus Grant 10,074,511 - Hirai , et al. September 11, 2	2018-09-11
Defect Quantification Method, Defect Quantification Device, And Defect Evaluation Value Display Device App 20170323435 - MINEKAWA; Yohei ; et al.	2017-11-09
Defect Observation Apparatus App 20170249753 - OTANI; Yuko ; et al.	2017-08-31
Defect Reviewing Method And Device App 20170082425 - MINEKAWA; Yohei ; et al.	2017-03-23
Defect Image Classification Apparatus App 20160358746 - HIRAI; Takehiro ; et al.	2016-12-08
Defect classification method, and defect classification system Grant 9,401,015 - Minekawa , et al. July 26, 2	2016-07-26
Method and apparatus for reviewing defect Grant 9,342,879 - Minekawa , et al. May 17, 2	2016-05-17
Device for classifying defects and method for adjusting classification Grant 8,892,494 - Ono , et al. November 18, 2	2014-11-18
Gui, Classification Apparatus, Classification Method, Program, And Storage Medium Storing The Classification Program App 20140331173 - Minekawa; Yohei ; et al.	2014-11-06
Defect observation method and defect observation device Grant 8,824,773 - Minekawa , et al. September 2, 2	2014-09-02
Method and Apparatus for Reviewing Defect App 20140219546 - Minekawa; Yohei ; et al.	2014-08-07
Defect Classification Method, And Defect Classification System App 20140072204 - Minekawa; Yohei ; et al.	2014-03-13
Defect Observation Method And Defect Observation Device App 20130140457 - Minekawa; Yohei ; et al.	2013-06-06
Device For Classifying Defects And Method For Adjusting Classification App 20120117010 - Ono; Makoto ; et al.	2012-05-10

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