Miki; Kazunobu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Miki; Kazunobu.The latest application filed is for "method of manufacturing semiconductor device that uses both a normal photomask and a phase shift mask for defining interconnect patterns".

Company Profile

0.11.11

Miki; Kazunobu - Tokyo JP
MIKI, KAZUNOBU - HYOGO JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor device Grant 8,178,981 - Kanzaki , et al. May 15, 2	2012-05-15
Method of manufacturing semiconductor device that uses both a normal photomask and a phase shift mask for defining interconnect patterns Grant 8,084,279 - Kasaoka , et al. December 27, 2	2011-12-27
Semiconductor device Grant 7,956,473 - Momono , et al. June 7, 2	2011-06-07
Method Of Manufacturing Semiconductor Device That Uses Both A Normal Photomask And A Phase Shift Mask For Defining Interconnect Patterns App 20100159690 - Kasaoka; Tatsuo ; et al.	2010-06-24
Semiconductor Device App 20100155960 - KANZAKI; Teruaki ; et al.	2010-06-24
Semiconductor device Grant 7,701,063 - Kanzaki , et al. April 20, 2	2010-04-20
Method of manufacturing semiconductor device that uses both a normal photomask and a phase shift mask for defining interconnect patterns Grant 7,696,081 - Kasaoka , et al. April 13, 2	2010-04-13
Semiconductor Device And Manufacturing Method Thereof App 20090026635 - MOMONO; Hiroyuki ; et al.	2009-01-29
Semiconductor device and method of manufacturing semiconductor device App 20080217786 - Kasaoka; Tatsuo ; et al.	2008-09-11
Semiconductor device test probe Grant 7,276,923 - Takemoto , et al. October 2, 2	2007-10-02
Semiconductor device test probe Grant 7,274,195 - Takemoto , et al. September 25, 2	2007-09-25
Semiconductor device App 20070182001 - Kanzaki; Teruaki ; et al.	2007-08-09
Semiconductor Device Test Probe Having Improved Tip Portion App 20050189955 - Takemoto, Megumi ; et al.	2005-09-01
Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter Grant 6,888,344 - Maekawa , et al. May 3, 2	2005-05-03
Semiconductor element test apparatus, and method of testing semiconductor element using the apparatus Grant 6,710,615 - Miki March 23, 2	2004-03-23
Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter Grant 6,646,455 - Maekawa , et al. November 11, 2	2003-11-11
Semiconductor device test probe having improved tip portion and manufacturing method thereof Grant 6,633,176 - Takemoto , et al. October 14, 2	2003-10-14
Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter App 20030090280 - Maekawa, Shigeki ; et al.	2003-05-15
Semiconductor element test apparatus, and method of testing semiconductor element using the apparatus App 20020149385 - Miki, Kazunobu	2002-10-17
Test Probe For Semiconductor Devices, Method Of Manufacturing Of The Same, And Member For Removing Foreign Matter App 20020097060 - MAEKAWA, SHIGEKI ; et al.	2002-07-25
Semiconductor Device App 20020011669 - FUJIKI, NORIAKI ; et al.	2002-01-31
Semiconductor device test probe, manufacturing method therefor and semiconductor device tested by the probe App 20010046715 - Takemoto, Megumi ; et al.	2001-11-29

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.