Meyer; Petra
Patent Applications and Registrations
Patent applications and USPTO patent grants for Meyer; Petra.The latest application filed is for "defect localization in software integration tests".
- Meyer; Petra - Walldorf DE
| Patent | Date |
|---|---|
| Evaluation of variant configuration using in-memory technology Grant 9,442,968 - Meyer , et al. September 13, 2 | 2016-09-13 |
| Defect Localization In Software Integration Tests App 20150370685 - Heymann; Juergen ; et al. | 2015-12-24 |
| Evaluation Of Variant Configuration Using In-memory Technology App 20150278347 - Meyer; Petra ; et al. | 2015-10-01 |
| Managing Consistent Interfaces for Goods Tag, Production Bill of Material Hierarchy, and Release Order Template Business Objects across Heterogeneous Systems App 20110307353 - Ringl; Benjamin ; et al. | 2011-12-15 |
| Architectural Design for Data Migration Application Software App 20100070556 - Heusermann; Knut ; et al. | 2010-03-18 |
| Modeling production processes using reusable defined manufacturing segments Grant 7,555,355 - Meyer June 30, 2 | 2009-06-30 |
| Modeling production processes using reusable defined manufacturing segments App 20070203602 - Meyer; Petra | 2007-08-30 |
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