loadpatents
name:-0.020492076873779
name:-0.015274047851562
name:-0.00048112869262695
Metzner; Craig Patent Filings

Metzner; Craig

Patent Applications and Registrations

Patent applications and USPTO patent grants for Metzner; Craig.The latest application filed is for "engineered substrates for use in crystalline-nitride based devices".

Company Profile
0.17.14
  • Metzner; Craig - Simi Valley CA
  • Metzner; Craig - Fremont CA US
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Engineered substrates for use in crystalline-nitride based devices
Grant 9,761,671 - Paranjpe , et al. September 12, 2
2017-09-12
Tensile separation of a semiconducting stack
Grant 9,356,188 - Paranjpe , et al. May 31, 2
2016-05-31
Engineered Substrates For Use In Crystalline-nitride Based Devices
App 20150187888 - Paranjpe; Ajit ;   et al.
2015-07-02
Tensile Separation Of A Semiconducting Stack
App 20150069420 - Paranjpe; Ajit ;   et al.
2015-03-12
Wafer processing hardware for epitaxial deposition with reduced backside deposition and defects
Grant 8,951,351 - Patalay , et al. February 10, 2
2015-02-10
Wafer processing hardware for epitaxial deposition with reduced auto-doping and backside defects
Grant 8,852,349 - Chacin , et al. October 7, 2
2014-10-07
Semiconductor process chamber vision and monitoring system
Grant 8,726,837 - Patalay , et al. May 20, 2
2014-05-20
Susceptor with backside area of constant emissivity
Grant 8,524,555 - Sanchez , et al. September 3, 2
2013-09-03
Split laser scribe
Grant 8,519,298 - Wang , et al. August 27, 2
2013-08-27
Apparatus temperature control and pattern compensation
Grant 8,372,203 - Chacin , et al. February 12, 2
2013-02-12
Susceptor With Backside Area Of Constant Emissivity
App 20120282714 - Sanchez; Errol ;   et al.
2012-11-08
Susceptor with backside area of constant emissivity
Grant 8,226,770 - Sanchez , et al. July 24, 2
2012-07-24
Split Laser Scribe
App 20110233176 - Wang; Jianmin ;   et al.
2011-09-29
Film formation apparatus and methods including temperature and emissivity/pattern compensation
Grant 7,691,204 - Chacin , et al. April 6, 2
2010-04-06
Semiconductor Process Chamber Vision And Monitoring System
App 20090314205 - Patalay; Kailash K. ;   et al.
2009-12-24
Method for hafnium nitride deposition
Grant 7,547,952 - Metzner , et al. June 16, 2
2009-06-16
Susceptor With Backside Area Of Constant Emissivity
App 20080274604 - Sanchez; Errol ;   et al.
2008-11-06
Wafer Processing Hardware For Epitaxial Deposition With Reduced Backside Deposition And Defects
App 20080066684 - PATALAY; KAILASH KIRAN ;   et al.
2008-03-20
Wafer processing hardware for epitaxial deposition with reduced auto-doping and backside defects
App 20080069951 - Chacin; Juan ;   et al.
2008-03-20
Semiconductor process chamber
App 20070089836 - Metzner; Craig ;   et al.
2007-04-26
Apparatus temperature control and pattern compensation
App 20070074665 - Chacin; Juan ;   et al.
2007-04-05
Film formation apparatus and methods including temperature and emissivity/pattern compensation
App 20070077355 - Chacin; Juan ;   et al.
2007-04-05
Method For Hafnium Nitride Deposition
App 20060208215 - Metzner; Craig ;   et al.
2006-09-21
Method for hafnium nitride deposition
App 20040198069 - Metzner, Craig ;   et al.
2004-10-07
Cyclical sequential deposition of multicomponent films
App 20030235961 - Metzner, Craig ;   et al.
2003-12-25

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed