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Metris N.V. Patent Filings

Metris N.V.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Metris N.V..The latest application filed is for "optical scanning probe".

Company Profile
0.4.3
  • Metris N.V. - Leuven BE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Optical scanning probe
Grant 8,353,059 - Crampton , et al. January 8, 2
2013-01-08
Optical Scanning Probe
App 20120026510 - Crampton; Stephen James ;   et al.
2012-02-02
Optical Scanning Probe
App 20090205088 - Crampton; Stephen James ;   et al.
2009-08-13
Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe
Grant 7,299,145 - De Jonge , et al. November 20, 2
2007-11-20
Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe
App 20070043526 - De Jonge; Lieven ;   et al.
2007-02-22
Optical probe for scanning the features of an object and methods therefor
Grant 7,009,717 - Van Coppenolle , et al. March 7, 2
2006-03-07
Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probe
Grant 6,944,564 - De Jonge , et al. September 13, 2
2005-09-13

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