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Metris IPR N.V. Patent Filings

Metris IPR N.V.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Metris IPR N.V..The latest application filed is for "optical probe for scanning the features of an object and methods thereof".

Company Profile
0.2.0
  • Metris IPR N.V. - Leuven BE
  • Metris IPR NV - Leuven BE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Optical probe for scanning the features of an object and methods thereof
Grant 7,428,061 - Coppenolle , et al. September 23, 2
2008-09-23
Method and device for the verification and identification of a measuring device
Grant 7,268,892 - Van Den Bossche September 11, 2
2007-09-11

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