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name:-0.0037040710449219
name:-0.00040102005004883
Merrill; Travis S. Patent Filings

Merrill; Travis S.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Merrill; Travis S..The latest application filed is for "measuring dielectric breakdown in a dynamic mode".

Company Profile
0.5.7
  • Merrill; Travis S. - Rutland VT
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Measuring Dielectric Breakdown In A Dynamic Mode
App 20140195175 - Cartier; Eduard A. ;   et al.
2014-07-10
Test structure, method and circuit for simultaneously testing time dependent dielectric breakdown and electromigration or stress migration
Grant 8,754,655 - Brochu, Jr. , et al. June 17, 2
2014-06-17
Measuring bias temperature instability induced ring oscillator frequency degradation
Grant 8,587,383 - Brochu, Jr. , et al. November 19, 2
2013-11-19
Measuring Bias Temperature Instability Induced Ring Oscillator Frequency Degradation
App 20130147562 - Brochu, JR.; David G. ;   et al.
2013-06-13
Test Structure, Method And Circuit For Simultaneously Testing Time Dependent Dielectric Breakdown And Electromigration Or Stress Migration
App 20130038334 - Brochu, JR.; David G. ;   et al.
2013-02-14
Dual Stage Voltage Ramp Stress Test for Gate Dielectrics
App 20120187974 - Brochu, JR.; David G. ;   et al.
2012-07-26
IC chip stress testing
Grant 7,512,506 - Aubel , et al. March 31, 2
2009-03-31
Ic Chip Stress Testing
App 20080297188 - Aubel; Oliver ;   et al.
2008-12-04

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