Meloni; Mark A.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Meloni; Mark A..The latest application filed is for "fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer".

Company Profile

4.10.6

Meloni; Mark A. - Carrollton TX
Meloni; Mark A. - Longmont CO
Meloni; Mark A. - Flower Mound TX
Meloni; Mark A. - Lewisville TX
Meloni; Mark A. - Louisville TX
Meloni, Mark A. - Flower Mount TX
Meloni; Mark A. - Tempe AZ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Microwave plasma source Grant 10,923,324 - Meloni February 16, 2	2021-02-16
Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer Grant 10,794,763 - Meloni , et al. October 6, 2	2020-10-06
Fiberoptically-coupled Measurement System With Reduced Sensitivity To Angularly-driven Variation Of Signals Upon Reflection From A Wafer App 20200264044 - Meloni; Mark A. ; et al.	2020-08-20
Microwave plasma source Grant 10,679,832 - Meloni	2020-06-09
Microwave Plasma Source App 20190157045 - Meloni; Mark A.	2019-05-23
Microwave Plasma Source App 20190013187 - Meloni; Mark A.	2019-01-10
Self referencing heterodyne reflectometer and method for implementing Grant 7,589,843 - Aiyer , et al. September 15, 2	2009-09-15
Heterodyne reflectometer for film thickness monitoring and method for implementing Grant 7,339,682 - Aiyer , et al. March 4, 2	2008-03-04
Heterodyne reflectomer for film thickness monitoring and method for implementing App 20060192973 - Aiyer; Arun Ananth ; et al.	2006-08-31
Optical closed-loop control system for a CMP apparatus and method of manufacture thereof Grant 6,991,514 - Meloni , et al. January 31, 2	2006-01-31
Multiprobe detection system for chemical-mechanical planarization tool Grant 6,960,115 - Weldon , et al. November 1, 2	2005-11-01
Multiprobe detection system for chemical-mechanical planarization tool Grant 6,805,613 - Weldon , et al. October 19, 2	2004-10-19
Multiprobe detection system for chemical-mechanical planarization tool App 20040038624 - Weldon, Matthew ; et al.	2004-02-26
Polishing pad window for a chemical mechanical polishing tool Grant 6,685,537 - Fruitman , et al. February 3, 2	2004-02-03
Method and apparatus for optical multi-angle endpoint detection during chemical mechanical planarization App 20020191197 - Bibby, Thomas F.A. JR. ; et al.	2002-12-19
Ultrasonic methods and apparatus for the in-situ detection of workpiece loss Grant 6,264,532 - Meloni July 24, 2	2001-07-24

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