Meissner; Jens
Patent Applications and Registrations
Patent applications and USPTO patent grants for Meissner; Jens.The latest application filed is for "monitoring components of manufacturing application systems with respect to application-specific metrics".
- Meissner; Jens - Karlsruhe DE
- Meissner; Jens - Mannheim DE
| Patent | Date |
|---|---|
| Monitoring Components Of Manufacturing Application Systems With Respect To Application-specific Metrics App 20210149384 - Dittmer; Martin ; et al. | 2021-05-20 |
| Narrow gap inspection system Grant 9,845,914 - Riecker , et al. December 19, 2 | 2017-12-19 |
| Narrow Gap Inspection System App 20160230923 - RIECKER; Alexander ; et al. | 2016-08-11 |
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