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Patent applications and USPTO patent grants for McNichols; Jason W..The latest application filed is for "surface coordinate system".
Patent | Date |
---|---|
Wafer edge defect inspection using captured image analysis Grant 7,968,859 - Young , et al. June 28, 2 | 2011-06-28 |
Surface coordinate system Grant 7,315,360 - Whitefield , et al. January 1, 2 | 2008-01-01 |
Surface coordinate system App 20060073617 - Whitefield; Bruce J. ;   et al. | 2006-04-06 |
Wafer edge defect inspection App 20050023491 - Young, Roger Y. B. ;   et al. | 2005-02-03 |
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