McNichols; Jason W.
Patent Applications and Registrations
Patent applications and USPTO patent grants for McNichols; Jason W..The latest application filed is for "surface coordinate system".
- McNichols; Jason W. - Portland OR
| Patent | Date |
|---|---|
| Wafer edge defect inspection using captured image analysis Grant 7,968,859 - Young , et al. June 28, 2 | 2011-06-28 |
| Surface coordinate system Grant 7,315,360 - Whitefield , et al. January 1, 2 | 2008-01-01 |
| Surface coordinate system App 20060073617 - Whitefield; Bruce J. ; et al. | 2006-04-06 |
| Wafer edge defect inspection App 20050023491 - Young, Roger Y. B. ; et al. | 2005-02-03 |
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