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Autism Associated Genetic Markers
App 20210222245 - Leppert; Mark ; et al. | 2021-07-22 |
Autism Associated Genetic Markers
App 20210054457 - Leppert; Mark ; et al. | 2021-02-25 |
Methods, apparatus, and system for global healing of write-limited die through bias temperature instability
Grant 10,068,660 - Gautam , et al. September 4, 2 | 2018-09-04 |
Methods, apparatus and system for screening process splits for technology development
Grant 10,054,630 - Uppal , et al. August 21, 2 | 2018-08-21 |
Method, apparatus, and system for targeted healing of write fails through bias temperature instability
Grant 9,916,212 - Gautam , et al. March 13, 2 | 2018-03-13 |
Methods, Apparatus And System For Screening Process Splits For Technology Development
App 20170292986 - Uppal; Suresh ; et al. | 2017-10-12 |
Methods, Apparatus, And System For Global Healing Of Write-limited Die Through Bias Temperature Instability
App 20170271032 - Gautam; Akhilesh ; et al. | 2017-09-21 |
Method, Apparatus, And System For Targeted Healing Of Write Fails Through Bias Temperature Instability
App 20170242759 - Gautam; Akhilesh ; et al. | 2017-08-24 |
Method, apparatus, and system for global healing of write-limited die through bias temperature instability
Grant 9,704,600 - Gautam , et al. July 11, 2 | 2017-07-11 |
Methods, apparatus and system for screening process splits for technology development
Grant 9,702,926 - Uppal , et al. July 11, 2 | 2017-07-11 |
Autism Associated Genetic Markers
App 20170166966 - Leppert; Mark ; et al. | 2017-06-15 |
Methods, apparatus and system for voltage ramp testing
Grant 9,599,656 - Uppal , et al. March 21, 2 | 2017-03-21 |
Method, apparatus, and system for global healing of stability-limited die through bias temperature instability
Grant 9,601,187 - Gautam , et al. March 21, 2 | 2017-03-21 |
Method, apparatus and system for targeted healing of stability failures through bias temperature instability
Grant 9,601,188 - Gautam , et al. March 21, 2 | 2017-03-21 |
Method to identify extrinsic SRAM bits for failure analysis based on fail count voltage response
Grant 9,548,136 - Joshi , et al. January 17, 2 | 2017-01-17 |
Semiconductor structure having test device
Grant 9,500,703 - Kumar , et al. November 22, 2 | 2016-11-22 |
Method To Identify Extrinsic Sram Bits For Failure Analysis Based On Fail Count Voltage Response
App 20160284421 - JOSHI; Vivek ; et al. | 2016-09-29 |
Wafer test structures and methods of providing wafer test structures
Grant 9,372,226 - Uppal , et al. June 21, 2 | 2016-06-21 |
Methods, Apparatus And System For Voltage Ramp Testing
App 20160146879 - Uppal; Suresh ; et al. | 2016-05-26 |
Semiconductor Structure Having Test Device
App 20160054383 - KUMAR; Anil ; et al. | 2016-02-25 |
Wafer Test Structures And Methods Of Providing Wafer Test Structures
App 20160025805 - UPPAL; Suresh ; et al. | 2016-01-28 |
Method And Apparatus For Inline Device Characterization And Temperature Profiling
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Methods, Apparatus And System For Screening Process Splits For Technology Development
App 20150346271 - Uppal; Suresh ; et al. | 2015-12-03 |
Autism Associated Genetic Markers
App 20150148251 - Leppert; Mark ; et al. | 2015-05-28 |
Integrated circuit with stress generator for stressing test devices
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Devices having bias temperature instability compensation
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Integrated Circuit With Stress Generator For Stressing Test Devices
App 20130293250 - McMahon; William ; et al. | 2013-11-07 |
Devices Having Bias Temperature Instability Compensation
App 20130208555 - McMahon; William ; et al. | 2013-08-15 |
Methods For Reliability Testing Of Semiconductor Devices
App 20130033285 - McMahon; William ; et al. | 2013-02-07 |
Autism Associated Genetic Markers
App 20100210471 - Leppert; Mark F. ; et al. | 2010-08-19 |
Encapsulated case edging
Grant 4,993,585 - McMahon February 19, 1 | 1991-02-19 |
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