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Patent applications and USPTO patent grants for Mclntosh, John Martin.The latest application filed is for "substrate topography compensation at mask design: 3d opc topography anchored".
Patent | Date |
---|---|
Substrate topography compensation at mask design: 3D OPC topography anchored App 20040058255 - Jessen, Scott ;   et al. | 2004-03-25 |
Calibration standard for high resolution electron microscopy App 20030193022 - Houge, Erik Cho ;   et al. | 2003-10-16 |
Mass spectrometer particle counter App 20020063201 - Houge, Erik Cho ;   et al. | 2002-05-30 |
X-ray system App 20010043667 - Antonell, Michael ;   et al. | 2001-11-22 |
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