McLaurin; Teresa Louise
Patent Applications and Registrations
Patent applications and USPTO patent grants for McLaurin; Teresa Louise.The latest application filed is for "latch circuitry for memory applications".
- McLaurin; Teresa Louise - Dripping Springs TX
- McLaurin; Teresa Louise - Austin TX
- McLaurin; Teresa Louise - Dripping Springson TX
| Patent | Date |
|---|---|
| Latch Circuitry for Memory Applications App 20210074353 - Chen; Andy Wangkun ; et al. | 2021-03-11 |
| Latch circuitry for memory applications Grant 10,847,211 - Chen , et al. November 24, 2 | 2020-11-24 |
| Latch Circuitry for Memory Applications App 20190325947 - Chen; Andy Wangkun ; et al. | 2019-10-24 |
| Scan cell for dual port memory applications Grant 10,222,418 - Chong , et al. | 2019-03-05 |
| Scan Cell for Dual Port Memory Applications App 20180156866 - Chong; Yew Keong ; et al. | 2018-06-07 |
| Partial scan cell Grant 9,612,280 - McLaurin April 4, 2 | 2017-04-04 |
| Partial Scan Cell App 20150143190 - MCLAURIN; Teresa Louise | 2015-05-21 |
| Inter-die Connection Within An Integrated Circuit Formed Of A Stack Of Circuit Dies App 20130256908 - Mclaurin; Teresa Louise | 2013-10-03 |
| Integrated circuit testing Grant 8,468,405 - McLaurin , et al. June 18, 2 | 2013-06-18 |
| Integrated circuit testing App 20120166902 - McLaurin; Teresa Louise ; et al. | 2012-06-28 |
| Scan chain cell with delay testing capability Grant 7,913,131 - McLaurin March 22, 2 | 2011-03-22 |
| Scan chain cell with delay testing capability App 20090177935 - McLaurin; Teresa Louise | 2009-07-09 |
| Wrapper serial scan chain functional segmentation Grant 7,308,631 - McLaurin December 11, 2 | 2007-12-11 |
| Validating test signal connections within an integrated circuit Grant 7,085,978 - McLaurin , et al. August 1, 2 | 2006-08-01 |
| Testing memory access signal connections Grant 6,999,900 - McLaurin , et al. February 14, 2 | 2006-02-14 |
| Wrapper serial scan chain functional segmentation App 20050283690 - McLaurin, Teresa Louise | 2005-12-22 |
| Testing memory access signal connections App 20050222809 - McLaurin, Teresa Louise ; et al. | 2005-10-06 |
| Resetting latch circuits within a functional circuit and a test wrapper circuit App 20040153915 - McLaurin, Teresa Louise | 2004-08-05 |
| Validating test signal connections within an integrated circuit App 20040054948 - McLaurin, Teresa Louise ; et al. | 2004-03-18 |
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