McKnight; William Stewart

Patent Applications and Registrations

Patent applications and USPTO patent grants for McKnight; William Stewart.The latest application filed is for "method for compensation of responses from eddy current probes".

Company Profile

0.12.16

McKnight; William Stewart - Hamilton OH

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for eddy current inspection of parts with complex geometries Grant 8,269,489 - Wang , et al. September 18, 2	2012-09-18
Methods and apparatus for testing a component Grant 8,013,599 - Suh , et al. September 6, 2	2011-09-06
System and method for inspection of parts with an eddy current probe Grant 7,994,780 - Sun , et al. August 9, 2	2011-08-09
Flexible eddy current array probe and methods of assembling the same Grant 7,952,348 - Sun , et al. May 31, 2	2011-05-31
Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same Grant 7,888,932 - McKnight , et al. February 15, 2	2011-02-15
Method For Compensation Of Responses From Eddy Current Probes App 20110004452 - Korukonda; Sanghamithra ; et al.	2011-01-06
Process And Apparatus For Testing A Component Using An Omni-directional Eddy Current Probe App 20100312494 - Korukonda; Sanghamithra ; et al.	2010-12-09
Multi-frequency image processing for inspecting parts having complex geometric shapes Grant 7,817,845 - Suh , et al. October 19, 2	2010-10-19
System And Method For Inspection Of Parts With Complex Geometries App 20100127699 - Wang; Changting ; et al.	2010-05-27
Eddy Current Probe And Methods Of Assembling The Same App 20090115410 - McKnight; William Stewart ; et al.	2009-05-07
Flexible Eddy Current Array Probe And Methods Of Assembling The Same App 20090115411 - Sun; Haiyan ; et al.	2009-05-07
System And Method For Inspection Of Parts App 20090072822 - Sun; Haiyan ; et al.	2009-03-19
Methods and apparatus for testing a component Grant 7,436,992 - Suh , et al. October 14, 2	2008-10-14
Multi-frequency Image Processing For Inspecting Parts Having Complex Geometric Shapes App 20080159619 - SUH; Ui Won ; et al.	2008-07-03
Method for performing model based scanplan generation of a component under inspection Grant 7,337,651 - Shankarappa , et al. March 4, 2	2008-03-04
Eddy Current Array Probes With Enhanced Drive Fields App 20070222439 - Wang; Changting ; et al.	2007-09-27
Inspection method and system using multifrequency phase analysis Grant 7,206,706 - Wang , et al. April 17, 2	2007-04-17
Eddy current probe and inspection method Grant 7,154,265 - Togo , et al. December 26, 2	2006-12-26
Method for performing model based scanplan generation of a component under inspection App 20060224348 - Shankarappa; Suneel Tumkur ; et al.	2006-10-05
Inspection method and system using multifrequency phase analysis App 20060217908 - Wang; Changting ; et al.	2006-09-28
Eddy current probe and inspection method App 20060132124 - Togo; Mottito ; et al.	2006-06-22
Eddy current array probes with enhanced drive fields App 20060132123 - Wang; Changting ; et al.	2006-06-22
Methods and apparatus for testing a component App 20060109001 - Suh; Ui Won ; et al.	2006-05-25
Omnidirectional eddy current probe and inspection system Grant 7,015,690 - Wang , et al. March 21, 2	2006-03-21
Methods and apparatus for testing a component App 20060023961 - Suh; Ui Won ; et al.	2006-02-02
Omnidirectional eddy current probe and inspection system App 20050264284 - Wang, Changting ; et al.	2005-12-01
Molded eddy current array probe Grant 6,812,697 - McKnight , et al. November 2, 2	2004-11-02
Molded eddy current array probe App 20040056656 - McKnight, William Stewart ; et al.	2004-03-25

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