McFarland; Ronald Cecil

Patent Applications and Registrations

Patent applications and USPTO patent grants for McFarland; Ronald Cecil.The latest application filed is for "system and method for radiographic inspection without a-priori information of inspected object".

Company Profile

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McFarland; Ronald Cecil - Cincinnati OH

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method, system and apparatus for processing radiographic images of scanned objects Grant 7,522,756 - Bueno , et al. April 21, 2	2009-04-21
System And Method For Radiographic Inspection Without A-priori Information Of Inspected Object App 20080159477 - Birdwell; Thomas William ; et al.	2008-07-03
System and method for analyzing and identifying flaws in a manufactured part Grant 7,272,254 - Shankarappa , et al. September 18, 2	2007-09-18
Method of processing test information Grant 7,194,474 - Birdwell , et al. March 20, 2	2007-03-20
Method and system to inspect a component Grant 7,065,176 - Moermond , et al. June 20, 2	2006-06-20
System and method for analyzing and identifying flaws in a manufactured part App 20050008213 - Shankarappa, Suneel Tumkur ; et al.	2005-01-13
Method And System To Inspect A Component App 20040240607 - Moermond, Kevin ; et al.	2004-12-02
Method of processing test information App 20040210586 - Birdwell, Thomas William ; et al.	2004-10-21
Method and apparatus for localized digital radiographic inspection Grant 6,614,872 - Bueno , et al. September 2, 2	2003-09-02
Method And Apparatus For Localized Digital Radiographic Inspection App 20030147493 - Bueno, Clifford ; et al.	2003-08-07

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