McCauley; Sharon

Patent Applications and Registrations

Patent applications and USPTO patent grants for McCauley; Sharon.The latest application filed is for "methods and systems for inspection of wafers and reticles using designer intent data".

Company Profile

2.8.9

McCauley; Sharon - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods and systems for inspection of wafers and reticles using designer intent data Grant 11,348,222 - Marella , et al. May 31, 2	2022-05-31
Methods and systems for inspection of wafers and reticles using designer intent data Grant 10,713,771 - Marella , et al.	2020-07-14
Methods And Systems For Inspection Of Wafers And Reticles Using Designer Intent Data App 20200074619 - Marella; Paul Frank ; et al.	2020-03-05
Methods And Systems For Inspection Of Wafers And Reticles Using Designer Intent Data App 20180247403 - Marella; Paul Frank ; et al.	2018-08-30
Methods and Systems for Inspection of Wafers and Reticles Using Designer Intent Data App 20150178914 - Marella; Paul Frank ; et al.	2015-06-25
Computer-implemented methods for performing one or more defect-related functions Grant 9,037,280 - Dishner , et al. May 19, 2	2015-05-19
Methods and systems for inspection of wafers and reticles using designer intent data Grant 9,002,497 - Volk , et al. April 7, 2	2015-04-07
Methods And Systems For Binning Defects Detected On A Specimen App 20090290784 - Lin; Jason Z. ; et al.	2009-11-26
Methods and systems for binning defects detected on a specimen Grant 7,570,800 - Lin , et al. August 4, 2	2009-08-04
Methods And Systems For Inspection Of Wafers And Reticles Using Designer Intent Data App 20080081385 - Marella; Paul Frank ; et al.	2008-04-03
Methods and systems for binning defects detected on a specimen App 20070133860 - Lin; Jason Z. ; et al.	2007-06-14
Computer-implemented methods for performing one or more defect-related functions App 20060287751 - Dishner; Mark ; et al.	2006-12-21
Flexible hybrid defect classification for semiconductor manufacturing Grant 7,142,992 - Huet , et al. November 28, 2	2006-11-28
Flexible Hybrid Defect Classification For Semiconductor Manufacturing App 20060265145 - Huet; Patrick ; et al.	2006-11-23
Methods and systems for inspection of wafers and reticles using designer intent data App 20050004774 - Volk, William ; et al.	2005-01-06

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