McArthur; Bruce B.

Patent Applications and Registrations

Patent applications and USPTO patent grants for McArthur; Bruce B..The latest application filed is for "method and apparatus for self-referenced wafer stage positional error mapping".

Company Profile

0.17.5

McArthur; Bruce B. - San Diego CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for self-referenced wafer stage positional error mapping Grant 7,871,002 - Smith , et al. January 18, 2	2011-01-18
Method and apparatus for registration with integral alignment optics Grant 7,337,552 - Smith , et al. March 4, 2	2008-03-04
Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion Grant 7,268,360 - Smith , et al. September 11, 2	2007-09-11
Method and apparatus for self-referenced dynamic step and scan intra-field lens distortion Grant 7,136,144 - Smith , et al. November 14, 2	2006-11-14
Method and apparatus for self-referenced wafer stage positional error mapping App 20060209276 - Smith; Adlai H. ; et al.	2006-09-21
Method and apparatus for self-referenced dynamic step and scan intra-field lens distortion App 20060109438 - Smith; Adlai H. ; et al.	2006-05-25
Method and apparatus for registration with integral alignment optics App 20060042106 - Smith; Adlai H. ; et al.	2006-03-02
Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion App 20060007431 - Smith; Adlai H. ; et al.	2006-01-12
In-situ source metrology instrument and method of use Grant 6,741,338 - McArthur , et al. May 25, 2	2004-05-25
In-situ source metrology instrument and method of use App 20030007143 - McArthur, Bruce B. ; et al.	2003-01-09
In-situ source metrology instrument and method of use Grant 6,356,345 - McArthur , et al. March 12, 2	2002-03-12
Apparatus and process for nozzle production utilizing computer generated holograms Grant 6,130,009 - Smith , et al. October 10, 2	2000-10-10
Apparatus method of measurement and method of data analysis for correction of optical system Grant 5,978,085 - Smith , et al. November 2, 1	1999-11-02
Apparatus, method of measurement, and method of data analysis for correction of optical system Grant 5,828,455 - Smith , et al. October 27, 1	1998-10-27
Plate correction technique for imaging systems Grant 5,640,233 - McArthur , et al. June 17, 1	1997-06-17
Gray level imaging masks and methods for encoding same Grant 5,538,817 - Smith , et al. July 23, 1	1996-07-23
Laser ablation control system and method Grant 5,523,543 - Hunter, Jr. , et al. June 4, 1	1996-06-04
Direct etch processes for the manufacture of high density multichip modules Grant 5,509,553 - Hunter, Jr. , et al. April 23, 1	1996-04-23
High power masks and methods for manufacturing same Grant 5,501,925 - Smith , et al. March 26, 1	1996-03-26
Apparatus and process for using Fresnel zone plate array for processing materials Grant 5,481,407 - Smith , et al. January 2, 1	1996-01-02
Plate correction of imaging systems Grant 5,392,119 - McArthur , et al. February 21, 1	1995-02-21
Apparatus and process for the production of fine line metal traces Grant 5,364,493 - Hunter, Jr. , et al. November 15, 1	1994-11-15

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