McAlpin; Neil
Patent Applications and Registrations
Patent applications and USPTO patent grants for McAlpin; Neil.The latest application filed is for "system for testing integrated circuits".
- McAlpin; Neil - Balmain AU
| Patent | Date |
|---|---|
| Diagnostic probe assembly for printhead integrated circuitry Grant 7,866,784 - Sleijpen , et al. January 11, 2 | 2011-01-11 |
| Apparatus for testing integrated circuitry Grant 7,863,890 - Sleijpen , et al. January 4, 2 | 2011-01-04 |
| Method for testing integrated circuits mounted on a carrier Grant 7,804,292 - Sleijpen , et al. September 28, 2 | 2010-09-28 |
| Diagnostic Probe Assembly For Printhead Integrated Circuitry App 20100045315 - Sleijpen; Stephen John ; et al. | 2010-02-25 |
| Apparatus For Testing Integrated Circuitry App 20100045330 - Sleijpen; Stephen John ; et al. | 2010-02-25 |
| System For Testing Integrated Circuits App 20100049464 - Sleijpen; Stephen John ; et al. | 2010-02-25 |
| Method For Testing Integrated Circuits Mounted On A Carrier App 20100045313 - Sleijpen; Stephen John ; et al. | 2010-02-25 |
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