Maznev; Alexei

Patent Applications and Registrations

Patent applications and USPTO patent grants for Maznev; Alexei.The latest application filed is for "systems and methods for quality control of a periodic structure".

Company Profile

2.7.9

Maznev; Alexei - Allston MA US
Maznev; Alexei - Natick MA
Maznev; Alexei - Cambridge MA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Systems and methods for quality control of a periodic structure Grant 10,241,058 - Maznev , et al.	2019-03-26
Systems and Methods for Quality Control of a Periodic Structure App 20180011031 - Maznev; Alexei ; et al.	2018-01-11
Method of measuring deep trenches with model-based optical spectroscopy Grant 7,839,509 - Rosenthal , et al. November 23, 2	2010-11-23
Method of Measuring Deep Trenches with Model-Based Optical Spectroscopy App 20090122321 - Rosenthal; Peter ; et al.	2009-05-14
Method of measuring sub-micron trench structures Grant 7,499,183 - Maznev March 3, 2	2009-03-03
Method of Measuring Sub-Micron Trench Structures App 20080123080 - Maznev; Alexei	2008-05-29
Method of determining properties of patterned thin film metal structures using transient thermal response Grant 7,365,864 - Gostein , et al. April 29, 2	2008-04-29
Measuring Diffractive Structures By Parameterizing Spectral Features App 20080049214 - Maznev; Alexei ; et al.	2008-02-28
Opto-acoustic apparatus with optical heterodyning for measuring solid surfaces and thin films Grant 7,327,468 - Maznev , et al. February 5, 2	2008-02-05
Method for measuring thin films App 20070109540 - Maznev; Alexei	2007-05-17
Method and apparatus for measuring thickness of thin films via transient thermoreflectance App 20070024871 - Maznev; Alexei	2007-02-01
Method of determining properties of patterned thin film meatal structures using transient thermal response App 20060203876 - Gostein; Michael ; et al.	2006-09-14
Opto-acoustic apparatus with optical heterodyning for measuring solid surfaces and thin films App 20040174529 - Maznev, Alexei ; et al.	2004-09-09
Method and device for simultaneously measuring the thickness of multiple thin metal films in a multilayer structure Grant 6,069,703 - Banet , et al. May 30, 2	2000-05-30

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