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Pixel sensors of multiple pixel size and methods of implant dose control
Grant 8,704,325 - Ellis-Monaghan , et al. April 22, 2 | 2014-04-22 |
Image sensor pixel structure employing a shared floating diffusion
Grant 8,405,751 - Hibbeler , et al. March 26, 2 | 2013-03-26 |
Pixel Sensors Of Multiple Pixel Size And Methods Of Implant Dose Control
App 20130001732 - ELLIS-MONAGHAN; John J. ; et al. | 2013-01-03 |
Pixel sensors of multiple pixel size and methods of implant dose control
Grant 8,334,195 - Ellis-Monaghan , et al. December 18, 2 | 2012-12-18 |
System and method for testing pattern sensitive algorithms for semiconductor design
Grant 8,201,132 - DeMaris , et al. June 12, 2 | 2012-06-12 |
Optical Sensor Including Stacked Photodiodes
App 20110072409 - Gambino; Jeffrey P. ; et al. | 2011-03-24 |
Pixel Sensors Of Multiple Pixel Size And Methods Of Implant Dose Control
App 20110057282 - ELLIS-MONAGHAN; John J. ; et al. | 2011-03-10 |
Optical sensor including stacked photodiodes
Grant 7,893,468 - Gambino , et al. February 22, 2 | 2011-02-22 |
Optical sensor including stacked photosensitive diodes
Grant 7,883,916 - Gambino , et al. February 8, 2 | 2011-02-08 |
Image Sensor Pixel Structure Employing A Shared Floating Diffusion
App 20110025892 - Hibbeler; Jason D. ; et al. | 2011-02-03 |
IC layout optimization to improve yield
Grant 7,818,694 - Allen , et al. October 19, 2 | 2010-10-19 |
Method, apparatus, and computer program product for displaying and modifying the critical area of an integrated circuit design
Grant 7,752,589 - Allen , et al. July 6, 2 | 2010-07-06 |
Method and system for analyzing an integrated circuit based on sample windows selected using an open deterministic sequencing technique
Grant 7,752,580 - Braasch , et al. July 6, 2 | 2010-07-06 |
IC design modeling allowing dimension-dependent rule checking
Grant 7,703,061 - Papadopoulou , et al. April 20, 2 | 2010-04-20 |
System And Method For Testing Pattern Sensitive Algorithms For Semiconductor Design
App 20100095254 - DeMaris; David L. ; et al. | 2010-04-15 |
Testing pattern sensitive algorithms for semiconductor design
Grant 7,685,544 - DeMaris , et al. March 23, 2 | 2010-03-23 |
Content based yield prediction of VLSI designs
Grant 7,661,081 - Allen , et al. February 9, 2 | 2010-02-09 |
Optical Sensor Including Stacked Photosensitive Diodes
App 20090294812 - Gambino; Jeffrey P. ; et al. | 2009-12-03 |
Optical Sensor Including Stacked Photodiodes
App 20090294813 - Gambino; Jeffrey P. ; et al. | 2009-12-03 |
Physical design characterization system
Grant 7,584,077 - Bergman Reuter , et al. September 1, 2 | 2009-09-01 |
IC design modeling allowing dimension-dependent rule checking
Grant 7,577,927 - Papadopoulou , et al. August 18, 2 | 2009-08-18 |
IC design modeling allowing dimension-dependent rule checking
Grant 7,555,735 - Papadopoulou , et al. June 30, 2 | 2009-06-30 |
System for search and analysis of systematic defects in integrated circuits
Grant 7,552,417 - Bergman Reuter , et al. June 23, 2 | 2009-06-23 |
IC Layout Optimization to Improve Yield
App 20090100386 - Allen; Robert J. ; et al. | 2009-04-16 |
IC layout optimization to improve yield
Grant 7,503,020 - Allen , et al. March 10, 2 | 2009-03-10 |
Ic Design Modeling Allowing Dimension-dependent Rule Checking
App 20090031265 - Papadopoulou; Evanthia ; et al. | 2009-01-29 |
Method And System For Analyzing An Integrated Circuit Based On Sample Windows Selected Using An Open Deterministic Sequencing Technique
App 20090031263 - Braasch; Sarah C. ; et al. | 2009-01-29 |
Ic Design Modeling Allowing Dimension-dependent Rule Checking
App 20090031266 - Papadopoulou; Evanthia ; et al. | 2009-01-29 |
Feature Extraction That Supports Progressively Refined Search And Classification Of Patterns In A Semiconductor Layout
App 20080320421 - Demaris; David L. ; et al. | 2008-12-25 |
System For Generating A Set Of Test Patterns For An Optical Proximity Correction Algorithm
App 20080247633 - DeMaris; David L ; et al. | 2008-10-09 |
System For Search And Analysis Of Systematic Defects In Integrated Circuits
App 20080232675 - Bergman Reuter; Bette L. ; et al. | 2008-09-25 |
System for search and analysis of systematic defects in integrated circuits
Grant 7,415,695 - Bergman Reuter , et al. August 19, 2 | 2008-08-19 |
Content Based Yield Prediction Of Vlsi Designs
App 20080195989 - Allen; Robert J. ; et al. | 2008-08-14 |
IC design modeling allowing dimension-dependent rule checking
Grant 7,404,164 - Papadopoulou , et al. July 22, 2 | 2008-07-22 |
method for generating a set of test patterns for an optical proximity correction algorithm
Grant 7,404,174 - DeMaris , et al. July 22, 2 | 2008-07-22 |
Method, Apparatus, And Computer Program Product For Displaying And Modifying The Critical Area Of An Integrated Circuit Design.
App 20080168414 - Allen; Robert J. ; et al. | 2008-07-10 |
Yield optimization in router for systematic defects
Grant 7,398,485 - Bickford , et al. July 8, 2 | 2008-07-08 |
Content based yield prediction of VLSI designs
Grant 7,389,480 - Allen , et al. June 17, 2 | 2008-06-17 |
Testing Pattern Sensitive Algorithms For Semiconductor Design
App 20080104555 - DeMaris; David L. ; et al. | 2008-05-01 |
System and method for testing pattern sensitive algorithms for semiconductor design
Grant 7,353,472 - DeMaris , et al. April 1, 2 | 2008-04-01 |
Ic Design Modeling Allowing Dimension-dependent Rule Checking
App 20080059929 - Papadopoulou; Evanthia ; et al. | 2008-03-06 |
IC Layout Optimization To Improve Yield
App 20070294648 - Allen; Robert J. ; et al. | 2007-12-20 |
System for search and analysis of systematic defects in integrated circuits
Grant 7,284,230 - Bergman Reuter , et al. October 16, 2 | 2007-10-16 |
Yield Optimization In Router For Systematic Defects
App 20070240090 - Bickford; JeanneP ; et al. | 2007-10-11 |
System For Search And Analysis Of Systematic Defects In Integrated Circuits
App 20070211933 - Reuter; Bette L. Bergman ; et al. | 2007-09-13 |
System and method for testing pattern sensitive algorithms for semiconductor design
App 20070038970 - DeMaris; David L. ; et al. | 2007-02-15 |
Content Based Yield Prediction Of Vlsi Designs
App 20060253806 - Allen; Robert J. ; et al. | 2006-11-09 |
Method and system for improving integrated circuit manufacturing productivity
Grant 7,076,749 - Kemerer , et al. July 11, 2 | 2006-07-11 |
System And Method For Generating A Set Of Test Patterns For An Optical Proximity Correction Algorithm
App 20060023932 - DeMaris; David L. ; et al. | 2006-02-02 |
Method And System For Improving Integrated Circuit Manufacturing Productivity
App 20050278663 - Kemerer, Douglas W. ; et al. | 2005-12-15 |
IC design modeling allowing dimension-dependent rule checking
App 20050172247 - Papadopoulou, Evanthia ; et al. | 2005-08-04 |
System For Search And Analysis Of Systematic Defects In Integrated Circuits
App 20050094863 - Bergman Reuter, Bette L. ; et al. | 2005-05-05 |
Physical design characterization system
Grant 6,823,496 - Bergman Reuter , et al. November 23, 2 | 2004-11-23 |
Physical Design Characterization System
App 20040221250 - Bergman Reuter, Betty L. ; et al. | 2004-11-04 |
Method for prediction random defect yields of integrated circuits with accuracy and computation time controls
Grant 6,738,954 - Allen , et al. May 18, 2 | 2004-05-18 |
Physical design characterization system
App 20030200513 - Bergman Reuter, Bette L. ; et al. | 2003-10-23 |
Efficient generation of fill shapes for chips and packages
Grant 5,636,133 - Chesebro , et al. June 3, 1 | 1997-06-03 |
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