Mayder; Romi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mayder; Romi.The latest application filed is for "power distribution network".

Company Profile

0.16.18

Mayder; Romi - Monte Sereno CA
Mayder; Romi - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Machine learning based methodology for adaptative equalization Grant 11,423,303 - Jiao , et al. August 23, 2	2022-08-23
Dynamic configuration of equivalent series resistance Grant 9,377,802 - Wyland , et al. June 28, 2	2016-06-28
Integrated circuit having a discrete capacitor mounted on a semiconductor die Grant 8,710,623 - Mayder , et al. April 29, 2	2014-04-29
Power distribution network Grant 8,410,579 - Ghia , et al. April 2, 2	2013-04-02
Power Distribution Network App 20120139083 - Ghia; Atul V. ; et al.	2012-06-07
Apparatus And Systems For Processing Signals Between A Tester And A Plurality Of Devices Under Test App 20110089966 - Mayder; Romi ; et al.	2011-04-21
Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array Grant 7,859,277 - Mayder , et al. December 28, 2	2010-12-28
Forced air cooling of components on a probecard Grant 7,541,824 - Mayder , et al. June 2, 2	2009-06-02
Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets Grant 7,502,974 - Garg , et al. March 10, 2	2009-03-10
Liquid cooled DUT card interface for wafer sort probing Grant 7,501,844 - Andberg , et al. March 10, 2	2009-03-10
Method and apparatus for a paddle board probe card Grant 7,459,921 - Mayder , et al. December 2, 2	2008-12-02
Wiffle tree components, cooling systems, and methods of attaching a printed circuit board to a heat sink Grant 7,460,371 - Andberg , et al. December 2, 2	2008-12-02
Inverted mesa quartz crystal time base reference for automatic test equipment App 20080169730 - Mayder; Romi ; et al.	2008-07-17
Liquid cooled dut card interface for wafer sort probing App 20080143363 - Andberg; John ; et al.	2008-06-19
Solid via with a contact pad for mating with an interposer of an ATE tester App 20080142252 - Mayder; Romi ; et al.	2008-06-19
Forced air cooling of components on a probecard App 20080143364 - Mayder; Romi ; et al.	2008-06-19
Mock wafer, system calibrated using mock wafer, and method for calibrating automated test equipment Grant 7,323,897 - Mayder January 29, 2	2008-01-29
Method and apparatus for a paddle board probe card App 20070296424 - Mayder; Romi ; et al.	2007-12-27
Method and apparatus for a high frequency coaxial through hole via in multilayer printed circuit boards App 20070278001 - Mayder; Romi ; et al.	2007-12-06
Method and apparatus for a low thermal impedance printed circuit board assembly App 20070278002 - Mayder; Romi ; et al.	2007-12-06
Wiffle tree components, cooling systems, and methods of attaching a printed circuit board to a heat sink App 20070274052 - Andberg; John William ; et al.	2007-11-29
Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array App 20070247140 - Mayder; Romi ; et al.	2007-10-25
Inexpensive low phase noise high speed stabilized time base App 20070236301 - Mayder; Romi	2007-10-11
Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets App 20070220387 - Garg; Preeti ; et al.	2007-09-20
Method and apparatus for a DUT contactor App 20070090849 - Mayder; Romi	2007-04-26
Zero insertion force printed circuit assembly connector system and method Grant 7,147,499 - Mayder , et al. December 12, 2	2006-12-12
Method and apparatus for non-contact cleaning of electronics App 20060236495 - Mayder; Romi ; et al.	2006-10-26
Parallel calibration system for a test device Grant 7,106,081 - Mayder , et al. September 12, 2	2006-09-12
Mock wafer, system calibrated using mock wafer, and method for calibrating automated test equipment App 20060132162 - Mayder; Romi	2006-06-22
Parallel calibration system for a test device App 20060006896 - Mayder; Romi ; et al.	2006-01-12
Timing calibration and timing calibration verification of electronic circuit testers App 20030030453 - Mayder, Romi ; et al.	2003-02-13

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